CDT Compound Semiconductor Physics (PhD Progression 1+3)

CDT 化合物半导体物理（博士进修 1 3）

• 批准号: 2881704
• 金额: --
• 依托单位: CARDIFF UNIVERSITY
• 依托单位国家: 英国
• 项目类别: Studentship
• 财政年份: 2023
• 资助国家: 英国
• 起止时间: 2023 至 无数据
• 项目状态: 未结题
• 来源: https://gtr.ukri.org/projects?ref=studentship-2881704
• 关键词: CDT; Compound; Semiconductor; Physics; PhD

This project will significantly advance practical optoelectronic-integrated-circuits (OEICs) with a suite of examples relevant to a major high-tech manufacturing company. The first circuit will use chromatic confocal profilometry, which is an established technique for measuring the shape of industrial parts and, where the part is transparent, its thickness. Systems commonly comprise a fibre-coupled broadband light source, a fibre splitter and a spectrometer all in a remote, control box, and an objective lens with axial chromatic dispersion at the point of measurement. Creating an equivalent chip based system will enable applications such as in-situ, on co-ordinate measuring machines, due to the size and weight advantages and the removal of the need for fibre routed through the machine. We will investigate novel schemes for integrating all the individual components into a photonic integrated circuit. The work will require the development of efficient, matched, emitters and detectors, the use of waveguides and, depending on the scheme or schemes investigated in hardware, spectrometers, modulators, analogue circuits, all integrated on a single chip. The successful outcome from the research will result in a novel, disruptive, technology for chromatic confocal profilometry with potential application to many areas of spectral measurement. Further ground breaking systems should follow.

该项目将通过一系列与一家大型高科技制造公司相关的示例，显着推进实用光电集成电路（OEIC）的发展。第一个电路将使用彩色共焦轮廓测定法，这是一种用于测量工业零件形状以及零件透明（如果零件是透明的）厚度的成熟技术。系统通常包括光纤耦合宽带光源、光纤分路器和光谱仪，全部位于远程控制箱中，以及在测量点具有轴向色散的物镜。由于尺寸和重量优势以及无需通过机器布线的光纤，创建等效的基于芯片的系统将能够在坐标测量机上进行原位等应用。我们将研究将所有单独组件集成到光子集成电路中的新颖方案。这项工作将需要开发高效、匹配的发射器和探测器，使用波导，并且根据硬件、光谱仪、调制器、模拟电路研究的方案，所有这些都集成在单个芯片上。该研究的成功结果将带来一种新颖的、颠覆性的彩色共焦轮廓测量技术，并有可能应用于光谱测量的许多领域。进一步的突破性系统应该随之而来。