MRI: Acquisition of High-Resolution Photon Emission/Laser Fault Injection Microscope with High-Performance Computers for Failure Analysis and Security Assessment of Electronic Syst

MRI：使用高性能计算机获取高分辨率光子发射/激光故障注入显微镜，用于电子系统的故障分析和安全评估

基本信息

批准号：
2117349
负责人：
Fatemeh Ganji
金额：
$ 36.06万
依托单位：
Worcester Polytechnic Institute
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2021
资助国家：
美国
起止时间：
2021-08-15 至 2024-07-31
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=2117349&HistoricalAwards=false
关键词：
MRI Acquisition Resolution Photon Emission

项目摘要

This MRI acquisition project will allow the purchase of a high-resolution Photon Emission/Laser Fault Injection microscope and high-performance computers. This setup will provide a platform for research, teaching, and hands-on experience for students and industry professionals. The research this instrumentation will enable focuses on the performance and security analyses of electronic devices and systems at different stages of their lifetime which will address a critical issue, securing the integrated circuit (IC) supply chain. The project has the potential to secure large number of devices used across sensitive applications, such as in healthcare, artificial intelligence (AI), finance, transportation, and defense. With a user-friendly interface, the instrument is expected to maximize the accessibility for on-site and off-campus students and researchers. The data collected from this setup will be further made available as benchmarks to researchers in the field of AI and cybersecurity. The instrument will bring unique capabilities to the PIs’ institution and surrounding areas to conduct research, education, and outreach activities on IC security. The PIs plan to educate and train students through online and on-site courses, as well as seminars and workshops. The PIs plan to promote broadening the participation in this research area, especially recruitment of female students. The MRI instrument is expected to facilitate research geared to the needs of the semiconductor industry, especially with the focus on security and reliability of ICs, including three interdisciplinary topics, IC tampering and counterfeiting detection, security testing and design for security, and security evaluation using AI. The common factor among these themes is the requirement for an advanced optical mechanism to interact with an integrated circuit at the scale of a single or a handful of transistors in a non-destructive fashion. While the first topic addresses the attacks that can be mounted during the pre- and post-fabrication, the second topic aims to provide a framework for testing and certifying a chip after manufacturing and designing a more secure chip. To achieve the goals defined in these themes, in the third topic, AI acts as an enabler since its essential role is to help analyze the data more efficiently and extract more in-depth and comprehensive information to back methodologies in the prior topics.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

该 MRI 采集项目将允许购买高分辨率光子发射/激光故障注入显微镜和高性能计算机，该设置将为学生和行业专业人士提供研究、教学和实践经验的平台。该仪器将重点关注电子设备和系统在其生命周期不同阶段的性能和安全性分析，这将解决保护集成电路（IC）供应链的关键问题。该项目有可能保护大量设备的安全。跨敏感应用程序使用，例如凭借用户友好的界面，该仪器有望最大限度地方便校内和校外的学生和研究人员从该设置收集的数据。该工具将进一步作为人工智能和网络安全领域研究人员的基准，为 PI 机构及周边地区开展 IC 安全研究、教育和推广活动带来独特的能力。通过在线和现场课程，以及PI 计划促进扩大该研究领域的参与，特别是招募女学生，预计 MRI 仪器将促进针对半导体行业需求的研究，特别是关注 IC 的安全性和可靠性。，包括三个跨学科主题，IC篡改和伪造检测、安全测试和安全设计以及使用人工智能的安全评估这些主题的共同因素是需要先进的光学机制与集成电路进行交互。单个或少数虽然第一个主题解决了在制造前和制造后可能发生的攻击，但第二个主题旨在提供一个在制造和设计更安全的芯片后测试和认证芯片的框架。为了实现这些主题中定义的目标，在第三个主题中，人工智能充当推动者，因为它的基本作用是帮助更有效地分析数据并提取更深入和更全面的信息来支持前面主题中的方法。该奖项反映了 NSF 的法定使命，并通过使用基金会的智力价值和更广泛的影响审查标准进行评估，被认为值得支持。