MRI: Acquisition of a High Resolution Photon Emission/Electro-Optical Microscope for Non-invasive Evaluation of Electronic Devices and Systems Security

MRI：获取高分辨率光子发射/光电显微镜，用于电子设备和系统安全的非侵入性评估

• 批准号: 1726716
• 负责人: Mark Tehranipoor
• 金额: $ 99.98万
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2017
• 资助国家: 美国
• 起止时间: 2017-10-01 至 2020-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1726716&HistoricalAwards=false
• 关键词: MRI; Acquisition; Resolution; Photon; Emission

This project, acquiring a new high resolution microscope, aims to allow users to analyze the performance of electronic devices and systems. With a user friendly interface and the use of intuition, the instrument is expected to maximize its accessibility for on-site use and for off campus users. The platform will be used for teaching, education, and outreach. This effort is shared by six universities in Florida. The effort enables:- Remote access capability to reach over 500 students every year both on and off campus; - Material and expertise on hardware security related topics for educators to incorporate in their classroom curricula;- Help to bring experts into their classrooms to discuss real-world applications; and - Exposure of undergraduates to advanced microscopy techniques. This new high resolution photon emission and electro-optical microscope enables the analysis by visualizing the transistor functionality non-destructively. When analyzing performance in this fashion, maximum impact is gained from multiple features such as: - New high sensitive detectors that enable high resolution; - Laser scanning configuration that enable static and dynamic failure analysis; - Static laser scanning stimulation that contribute to identify the source of shorts and resistive defects; and - Electro-optical probing and frequency mapping that enable rapid identification of regions of interest. The unique capabilities of the instrument constitute a critical enabling parameter for research in hardware and system security areas. These include:- Counterfeit detection by providing more detailed data than general electrical tests in less expensive and non-destructive manner; - Semi-invasive physical attacks by enabling advanced contactless probing techniques and laser injection to measure circuit activity; - Trojan detection by performing trust analysis of fabricated integrated circuits for validation of security and trust; and- Reverse and anti-reverse engineering by complementing conventional reverse engineering and extracting the intellectual property blocks critic information.

该项目购买了新型高分辨率显微镜，旨在让用户分析电子设备和系统的性能。凭借用户友好的界面和直观的使用，该仪器有望最大限度地提高现场使用和校外用户的可访问性。该平台将用于教学、教育和宣传。佛罗里达州的六所大学共同努力。这项工作能够： - 每年可覆盖校内和校外 500 多名学生的远程访问能力； - 硬件安全相关主题的材料和专业知识，供教育工作者纳入课堂课程； - 帮助专家进入课堂讨论实际应用； - 本科生接触先进的显微镜技术。这种新型高分辨率光子发射和电光显微镜可以通过非破坏性地可视化晶体管功能来进行分析。以这种方式分析性能时，可以从多种功能中获得最大的影响，例如： - 可实现高分辨率的新型高灵敏度探测器； - 激光扫描配置可实现静态和动态故障分析； - 静态激光扫描刺激有助于识别短路和电阻缺陷的来源； - 电光探测和频率映射，可快速识别感兴趣区域。该仪器的独特功能构成了硬件和系统安全领域研究的关键支持参数。其中包括： - 通过以更便宜和非破坏性的方式提供比一般电气测试更详细的数据来检测假冒产品； - 通过使用先进的非接触式探测技术和激光注入来测量电路活动，进行半侵入式物理攻击； - 通过对制造的集成电路进行信任分析来检测木马，以验证安全性和信任； - 逆向和反逆向工程，通过补充传统逆向工程并提取知识产权块关键信息。