MRI: Acquisition of a High Resolution X-Ray Diffraction System for Materials Research at The City College of New York

MRI：纽约城市学院购买用于材料研究的高分辨率 X 射线衍射系统

• 批准号: 0923084
• 负责人: Maria Tamargo
• 金额: $ 47.5万
• 依托单位: CUNY City College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-10-01 至 2011-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0923084&HistoricalAwards=false
• 关键词: MRI; Acquisition; Resolution; Ray; Diffraction

0923084TamargoCUNY City CollegeTECHNICAL SUMMARY: This proposal aims to establish a comprehensive X-ray diffraction analysis facility at The City College of New York (CCNY) that enables a wide range of materials research programs and educational programs in areas spanning molecular beam epitaxy, nanotechnology, materials synthesis, crystal growth and environmental science. CCNY has identified Materials Research as a strategic area of growth. This instrument will be essential to accomplish that goal. We propose to acquire a High Resolution X-ray diffraction apparatus for Materials Research that is especially suitable for thin film applications such as rocking curve analysis, reciprocal space mapping, reflectometry, thin film phase analysis, residual stress and texture analysis, and nanoparticle structure analysis. In addition to four-bounce high resolution optics, the system will incorporate micro-diffraction, glancing angle X-ray diffraction, X-ray reflectometry and a Nano-accessory kit. Important advances in nanoscience and nanotechnology, environmental science, energy systems and materials science are anticipated outcomes. There are eleven participating faculty from CCNY whose research will benefit immediately from this instrument acquisition. Participants from other CUNY Colleges and neighboring institutions, as well as industrial partners will also be users. CCNY is a minority institution with an exceedingly diverse student population at both the graduate and undergraduate levels. Having the proposed instrumentation in-house will expose our students to state-of-the-art techniques in materials science, will attract more students to research, and will increase the involvement of underrepresented minority students in these vital scientific areas. LAYMAN SUMMARY: X-ray diffraction is a fundamental analytical tool that allows the investigation of the atomic arrangement of materials, and many structural properties, such as the presence and nature of defects, or special atomic ordering in materials. Materials are used in many critical applications, including electronic and photonic semiconductor devices, solar cells, etc. The knowledge of the precise atomic arrangements of materials is essential in order to improve their properties, design new materials, and understand the fundamental physics that govern their behavior. At the City College of New York (CCNY), we have identified Materials Research as a top priority in which to focus our efforts, due to the potential impact of this discipline in our nation?s economic and technological development. A High Resolution X-ray diffraction apparatus is essential to perform the state-of-the-art research in materials that our faculty are trained to do. This instrument is multifaceted and versatile. In addition to offering the high resolution options needed for the investigation of highly ordered crystalline structures, it allows the incorporation of accessories that facilitate other studies carried out by our faculty. Important advances in nanoscience and nanotechnology, environmental science, energy systems and materials science are anticipated. CCNY has an exceedingly diverse student population, with large fractions of students from underrepresented minority groups. This instrument will expose a large number of students to state-of-the-art techniques in materials science, will attract more students to research, and will increase the involvement of underrepresented minority students in these vital scientific areas.

0923084TAMARGOCUNY CITY COLLEGNICAL摘要：该提案旨在在纽约市城市学院（CCNY）建立全面的X射线衍射分析设施，该设施可在跨越分子束相邻，材料，材料综合和环境科学，水晶科学的领域中进行广泛的材料研究计划和教育计划。 CCNY将材料研究确定为增长的战略领域。该工具对于实现这一目标至关重要。我们建议为材料研究获取高分辨率X射线衍射设备，该设备特别适用于薄膜应用，例如摇摆曲线分析，相互空间映射，反射测量法，薄膜相分析，残留应力和纹理分析以及纳米粒子结构分析。除了四弹力高分辨率光学元件外，该系统还将结合微分折射，瞥见角度X射线衍射，X射线反射仪和纳米辅助试剂盒。纳米科学和纳米技术，环境科学，能源系统和材料科学的重要进展是预期的。 CCNY有11位参与教师，他们的研究将从此工具中立即受益。来自其他CUNY学院和邻近机构的参与者以及工业合作伙伴也将是用户。 CCNY是一家少数族裔机构，在研究生和本科生中，学生人数都非常多样化。在内部提议的仪器将使我们的学生了解材料科学领域的最先进技术，将吸引更多的学生进行研究，并将增加这些重要科学领域代表性不足的少数族裔学生的参与。外行摘要：X射线衍射是一种基本的分析工具，可以研究材料的原子布置，以及许多结构特性，例如缺陷的存在和性质，或材料中特殊的原子订购。材料用于许多关键应用中，包括电子和光子半导体设备，太阳能电池等。确切的原子布置材料的知识对于改善其性质，设计新材料并了解控制其行为的基本物理学至关重要。在纽约城市学院（CCNY），由于该学科对我们国家的经济和技术发展的潜在影响，我们将材料研究确定为重点的重点。高分辨率的X射线衍射设备对于对我们的教职员工进行培训的材料进行最先进的研究至关重要。该仪器是多方面的和多功能的。除了提供调查高度有序的晶体结构所需的高分辨率选项外，它还允许合并配件，以促进我们教职员工进行的其他研究。预计纳米科学和纳米技术，环境科学，能源系统和材料科学的重要进展。 CCNY的学生人数非常多样化，来自代表性不足的少数群体的学生大量学生。该乐器将使大量学生接触到材料科学领域的最先进技术，吸引更多的学生进行研究，并将增加这些重要科学领域中代表性不足的少数族裔学生的参与。