Optical frequency domain reflectometry on a chip

芯片上的光频域反射计

• 批准号: 500311-2016
• 负责人: Poon, Joyce
• 金额: $ 5.54万
• 依托单位: University of Toronto
• 依托单位国家: 加拿大
• 项目类别: Collaborative Research and Development Grants
• 财政年份: 2017
• 资助国家: 加拿大
• 起止时间: 2017-01-01 至 2018-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=618653
• 关键词: Optical; frequency; domain; reflectometry; chip

This project will investigate integrated photonic devices, circuits, and proof-of-concept prototypes for on-chip optical frequency domain reflectometry (OFDR) systems. OFDR is an interferometry technique that extracts the positions and optical scattering strengths of scatterers along the propagation path of a light beam from the backscattered light. OFDR is a highly versatile measurement technique. For example, it enables the rapid measurement of the optical propagation losses in waveguides in a single shot, the determination of faults and defects that are far away from the light source, and distributed measurements of temperature and mechanical stress. At present, commercially available instruments for OFDR are bulky, constructed from bulk and fiber optics, and expensive. This project will overcome the limitations of cost and size of OFDR using state-of-the-art photonic integrated circuit technology. We will demonstrate chip-scale versions of the reflectometer using a customized photonic platform on silicon, the workhorse material of electronics. The partner company, a world leader in optical test and measurement equipment, will provide invaluable expertise in specifying the requirements of OFDR and translating the results into practice, while the University of Toronto team will develop the physical technologies. Not only can the research results increase the productivity in the partner company and lead to potentially new products, they will also have significant impact to the fields of photonic integration and optical communications, where OFDR can reduce design and manufacturing costs. Ultimately, enhanced test and measurement capabilities often open areas of research and discovery by enabling users to quantify the physical world in new ways.

该项目将研究用于芯片光学频域反射测量法（OFDR）系统的集成光子设备，电路和概念验证原型。 OFDR是一种干涉测量技术，可从反向散射光的光束沿光束的传播路径提取散射器的位置和光学散射强度。 OFDR是一种用途高度的测量技术。例如，它可以快速测量单个镜头中波导中的光学传播损失，远离光源的断层和缺陷的测定以及温度和机械应力的分布测量。目前，OFDR的市售仪器是笨重的，由散装和光纤制成，且昂贵。该项目将使用最先进的光子集成电路技术克服成本和OFDR的尺寸的局限性。我们将使用硅的定制光子平台（电子主力材料）上的定制光子平台演示反射计的芯片尺度版本。合作伙伴公司是光学测试和测量设备的全球领导者，将提供宝贵的专业知识，以指定OFDR的要求并将结果转化为实践，而多伦多大学团队将开发物理技术。研究结果不仅可以提高合作伙伴公司的生产率并导致潜在的新产品，还将对光子整合和光学通信领域产生重大影响，在这些领域中，OFDR可以降低设计和制造成本。最终，增强的测试和测量能力通常通过使用户能够以新的方式量化物理世界来开放研究和发现领域。