Development of high-frequency scanning near-field microscopy and investigation of its applications

高频扫描近场显微镜的研制及其应用研究

• 批准号: 15360181
• 负责人: NOZOKIDO Tatsuo
• 金额: $ 9.66万
• 依托单位: University of Toyama (2005)Tohoku University (2003-2004)
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2003
• 资助国家: 日本
• 起止时间: 2003 至 2005
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-15360181/
• 关键词: Scanning Near-Field Microscopy; Slit Probe; Millimeter Wave; Terahertz Wave; Passive Microscopy; Multi Function; Application; 高分解能化; スリット型プロ-ブ

Diffraction effects limit the resolution of conventional imaging microscopes to about the radiation wavelength used. However, sub-wavelength resolution below the diffraction limit can be achieved by the technique of scanning near-filed microscopy. The objective of this research project is to develop new microscopy formats and their related technologies in the millimeter-wave and terahertz regions in regard to our original microscope system using a metal slit-type probe that we had developed mainly in the millimeter-wave region, and to investigate new applications of the millimeter-wave and terahertz microscopy.We have proposed and experimentally demonstrated scanning near-field anisotropy microscopy in the millimeter-wave region, permitting the observation of electrical anisotropy in the viewed object. We also proposed a passive microscopy format that enables completely non-destructive and non-invasive measurements and succeeded to experimentally demonstrate its image reconstruction pr … More inciple in the millimeter-wave region. In order to improve measurement sensitivity of the slit probe, we have proposed, designed and fabricated a resonant slit-type probe for millimeter-wave microscopy. Experiments performed in the millimeter-wave region show that the resonant probe has more than ten times greater sensitivity than a conventional tapered slit-type probe.To demonstrate terahertz microscopy using a slit-type probe, we have tried to optimize the geometry of the tapered slit probe operated at a terahertz frequency band of 0.3 THz. Based on the design criteria derived from the optimization process, a tapered slit probe was fabricated by electro-forming technique. We have verified that the measured RF performance of the probe agrees well with the predicted one obtained using the finite element method.We have applied the above mentioned microscopy formats and technologies to the characterization of planar dielectric substrates, liquid crystal materials etc. in the millimeter-wave region. Effectiveness of them has been experimentally verified. Less

衍射效应将常规成像显微镜的分辨率限制为所使用的辐射波长。但是，通过扫描近乎固定的显微镜的技术可以实现低于衍射极限的次波长分辨率。该研究项目的目的是使用金属裂缝型探测器在我们的原始显微镜系统方面开发新的显微镜格式及其相关技术，并在我们的原始显微镜系统方面开发了我们主要在毫米波区域中开发的，并研究了毫米和terahertz Mirciers的新应用。 in the millimeter-wave region, permitting the observation of electrical anisotropy in the viewed object.We also proposed a passive microscopy format that enables completely non-destructive and non-invasive measurements and succeeded to experimentally demonstrate its image reconstruction pr … More In order to improve measurement sensitivity of the slit probe, we have proposed, designed and fabricated a resonant slit-type probe for毫米波显微镜。在毫米波区域进行的实验表明，与常规的锥形缝隙型探针相比，谐振探针具有超过十倍的敏感性。为了证明使用狭缝型探针证明Terahertz显微镜，我们试图优化锥形的缝隙探针在Terahertz频率compery compers and n.3 thz中的锥形缝隙探针的几何形状。基于优化过程得出的设计标准，通过电形成技术制造了锥形缝隙探针。我们已经证实，测得的探针的RF性能与使用有限元方法获得的预测的RF性能非常吻合。我们已将上述显微镜格式和技术应用于毫米波区域的平面涂层底物，液晶材料等的表征。它们的有效性已经过实验验证。较少的

项目成果

High-transmission waveguide with a small radius of curvature at a bend fabricated by use of a circular photonic crystal

使用圆形光子晶体制造的弯曲处小曲率半径的高传输波导

• 发表时间: 2005
• 期刊: Optics Letters 30
• 作者: Zhao Haizhen;Kikuo Ujihara;池上 敬一;池上 敬一;池上 敬一;N.Horiuchi
• 通讯作者: N.Horiuchi

T.Nose(能勢敏明): "Refractive Index Determination of the Nematic Liquid Crystal Materials by Using a Simple Measurement System in the Millimeter Wave Region"Conf.Digest of the 11th International Conference on Terahertz Electronics(THz2003. 84 (2003)

T.Nose（Toshiaki Nose）：“在毫米波区域使用简单测量系统测定向列液晶材料的折射率”第11届太赫兹电子学国际会议Conf.Digest（THz2003.84（2003））

T.Nose(能勢敏明): "Determination of the Insertion Loss and Refractive Index Anisotropy in the Nematic Liquid Crystal Materials Using a V-Band Trans-mission Cell"Molecular Crystals and Liquid Crystals. (発表予定). (2004)

T.Nose（Toshiaki Nose）：“使用 V 波段传输单元测定向列液晶材料中的插入损耗和折射率各向异性”分子晶体和液晶（即将发表）。

Determination of the Insertion Loss and Refractive Index Anisotropy in the Nematic Liquid Crystal Materials Using a V-Band Transmission Cell

使用 V 波段透射池测定向列液晶材料中的插入损耗和折射率各向异性

• 发表时间: 2004
• 期刊: Molecular Crystals and Liquid Crystals 409巻
• 作者: T.Nozokido(莅戸立夫);T.Nose (能勢敏明);N.Horiuchi(堀内典明);T.Nose;T.Nozokido;N.Horiuchi;T.Nose(能勢敏明);T.Nose(能勢敏明);T.Nozokido(莅戸立夫);N.Horiuchi(堀内典明);T.Nozokido(莅戸立夫);T.Nose (能勢敏明)
• 通讯作者: T.Nose (能勢敏明)

A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy

用于毫米波扫描近场显微镜的谐振狭缝型探头

• 发表时间: 2004
• 期刊: IEICE Trans. Electron. E87-C・12
• 作者: Tatsuo Nozokido;Tomohiro Ohbayashi;Jongsuck Bae;Koji Mizuno
• 通讯作者: Koji Mizuno