Research on Millimeter-Wave and Submillimeter-Wave Scanning Near-Field Microscopy

毫米波和亚毫米波扫描近场显微镜研究

基本信息

批准号：
13650365
负责人：
NOZOKIDO Tatsuo
金额：
$ 2.24万
依托单位：
Tohoku University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (C)
财政年份：
2001
资助国家：
日本
起止时间：
2001 至 2002
项目状态：
已结题

项目摘要

The objective of this research project is to demonstrate the new type of scanning near-field microscopy, i.e. scanning near-field anisotropy microscopy (SNAM) and to quantify images obtained from the scanning near-field microscope system using a metal slit-type probe which we have proposed and developed, in order to visualize physical parameters of objects such as refractive index and refractive index anisotropy, in the millimeter-wave and submillimeter-wave regions. The results obtained in the term of the project follow.In order to quantify images more precisely in the millimeter- and submillimeter-wave regions, we have proposed, designed, and made a new type of sample base to reduce needless signal fluctuations originated from surface modes. We have successfully demonstrated the effectiveness of this new hardware and found that the signal fluctuation reduces to less than 10% of the previous one. This result means that the microscope system we have developed have a potential to give a limiting refractive index sensitivity of better than Δn/n〜0.1. Furthermore, in order to visualize physical parameters of objects, we have proposed an equivalent circuit to describe the interaction between the probe and object, and succeeded to demonstrate the validity of the circuit by computer simulation using a finite element method and by experiments in the millimeter-wave region.We have tried to visualize anisotropy of objects by including an anisotropy model derived from two-dimensional refractive idex ellipsoid in the image reconstruction process using a block-gradient method, which is a kind of iterative reconstruction technique. An isotropic metal patch, a wire gird with large anisotropy, and a LiNbO_3 crystal which is a typical anisotropic dielectric, were experimentally tested in the millimeter-wave region and the images were reconstructed. We have found that anisotropy of these objects are clearly imaged with a resolution of less than 1/10 of the radiation wavelength used.

这样做的目的是证明近场显微镜PY（SNAM），并使用我们已经支撑和开发的金属裂缝型探针来量化从扫描近场显微镜系统中获得的图像，以便可视化参数对象，例如Andex。和折射率各向异性毫米波和亚毫米波区域。样品的类型降低了不必要的波动，我们成功地证明了有效的硬件，发现发现发现那是那个thare的人。信号波动大于显微镜系统的10％。通过使用有限元方法和毫米波区域中的实验来通过计算机进行电路的探头和对象TY。韦德通过在对象的各向异性模型中可视化对象各向异性的各向异性模型，该模型使用两种性折射IDEX结构过程得出方法是一种迭代的重新介绍，是一种典型的各向异性介质的晶体，在毫米波重新构成中进行了实验。所使用的辐射波长第三次小于1/10。