Development of Active Modulation Image Processing Ultra High Resolution Electron Microscope

主动调制图像处理超高分辨率电子显微镜的研制

• 批准号: 04555020
• 负责人: SHIMIZU Ryuichi
• 金额: $ 10.88万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Developmental Scientific Research (B)
• 财政年份: 1992
• 资助国家: 日本
• 起止时间: 1992 至 1993
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-04555020/
• 关键词: active image processing; ultra high resolution electron microscope; aberration-free observation; real-time image processing; acceleration voltage modulation; staining free observation; 原子レベル像観察; 無収差像; 金微粒子; 焦点ブレ変調; 高圧変調

Research has been proceeded as planned. The results are summarized as follows ;(1) Accelerating voltage modulation type active modulation image processing electron microscope has been successfully developed. We drove the feed back circuit of high voltage power supply in order to superimpose the modulation voltage onto accelerating voltage. This enabled tailored defocus-modulation to be attained by high speed. The result has been reported in paper (1).(2) We have developed a novel defocus-modulation technique, called functionized irradiation time control method, This method is to control irradiation time of primary beam according to the weight function for defocus-modulation image processing. The first data were described in the paper (2).(3) Applying this functionized irradiation time control method for active image processing electron microscopy we succeeded in the aberration-free observation of Au-particle. This observation has confirmed that the position of Au-atoms can be determined accurately. (paper (3)).(4) We have been involved in application of this method for electron microscopic observation of biological samples under just-focus condition. It is noted that these biological samples are no more stained for electron microscopic observation. This reduces significantly the artifact caused by the staining.

研究已按计划进行。主要研究成果如下：(1)研制成功加速电压调制型主动调制图像处理电子显微镜。我们驱动高压电源的反馈电路，以便将调制电压叠加到加速电压上。这使得能够以高速实现定制的散焦调制。结果已在论文（1）中报道。（2）我们开发了一种新颖的散焦调制技术，称为函数化照射时间控制方法，该方法根据散焦调制的权重函数来控制主光束的照射时间图像处理。第一个数据在论文（2）中描述。（3）将这种功能化照射时间控制方法应用于主动图像处理电子显微镜，我们成功地对金颗粒进行了无像差观察。这一观察证实了可以准确地确定金原子的位置。 （论文（3））。（4）我们已参与应用该方法对生物样品进行准聚焦条件下的电子显微镜观察。值得注意的是，这些生物样品不再被染色用于电子显微镜观察。这显着减少了由染色引起的伪影。

项目成果

高井義造,谷口佳史,志水隆一: "Determination of Partially Coherent Parameters by Latlice Image Contrast in TEM" J.Electron Microscopy. 42. 7-13 (1993)

Yoshizo Takai、Yoshifumi Taniguchi、R​​yuichi Shimizu：“通过 TEM 中的晶格图像对比度确定部分相干参数”J.Electron Microscopy 42. 7-13 (1993)。

高井義造,谷口佳史,生田孝,志水隆一: "Spherical Aberration-free Observation of Profile Images of Au (011) Surface by Defocus-modulation Image Processing" Ultramicroscopy. 44. (in press) (1994)

Yoshizo Takai、Yoshifumi Taniguchi、Takashi Ikuta、Ryuichi Shimizu：“通过散焦调制图像处理对 Au (011) 表面的轮廓图像进行无球差观察”Ultramicroscopy 44。（出版中）（1994 年）。

安藤俊行,谷口佳史,高井義造,木村吉秀,志水隆一: "Development of Real-time Defocus Modulation Type Image Processing for Spherical-aberration-free TEM" Ultramicroscopy. 44(in press). (1994)

Toshiyuki Ando、Yoshifumi Taniguchi、Yoshizo Takai、Yoshihide Kimura、Ryuichi Shimizu：“无球面像差 TEM 的实时散焦调制型图像处理的开发”Ultramicroscopy（1994 年）。

高井義造,谷口佳史,志水隆一: "Determination of Partially Coherent Parameters by Lattice Image Contrast in TEM" J. Electron Microscopy. 42. 7-13 (1993)

Yoshizo Takai、Yoshifumi Taniguchi、R​​yuichi Shimizu：“通过 TEM 中的晶格图像对比度确定部分相干参数”J. 电子显微镜 42. 7-13 (1993)。

Y.Tamiguchi.Y.Takai R.Shimzu,I.Ikuta: "Sphirical Abberation-free operwation of TEM-imeges oy defocrs-wodwation Imege Troceising" Wtramicroscepy. 41. 323-333 (1992)

Y.Tamiguchi.Y.Takai R.Shimzu,I.Ikuta：“TEM 图像的无球差操作和 defocrs-wodwation Imege Troceising”Wtramicroscepy。