Real-Time Active Modulation Electron Microscopy

实时主动调制电子显微镜

• 批准号: 07555024
• 负责人: SHIMIZU Ryuichi
• 金额: $ 10.88万
• 依托单位: Osaka University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (A)
• 财政年份: 1995
• 资助国家: 日本
• 起止时间: 1995 至 1996
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07555024/
• 关键词: Active Modulation Processing; Accelerating voltage Modulation; Real-time Processing; Spherical-Aberration-Free Observation; High-Resolution Electron Microscopy; 無収差電子顕微鏡法; 実時間変調処理法; 位相像分解観察; 実時間画像処理; 位相コントラスト; 高圧変調; 電子顕微鏡

The results obtained through the present research project are as follows :(1) Accelerating voltage modulation system for real-time active modulation processing has been successfully constructed.(2) Modulation signals which has been derived from the characteristics of electron optical system was transformed through optical fiber to the modulation system installed in high voltage tank.(3) The deformation of modulation signals due to the response of feedback system of accelerating voltage power supply was successfully compensated by overlapping the correction signals onto the modulation signals.(4) We have been involved in observing unstained biological samples under the real-time active modulation electron microscope and high contrast image have been observed so far.However, the stability of the entire electron microscope has been gradually deteriorating and this limited the high-resolution observation.

通过本研究项目获得的结果如下：（1）已成功构建了用于实时主动调制处理的加速电压调制系统。（2）通过电子光学系统的特性得出的调制信号通过（3）由于反馈系统的响应加速电压电源的响应，通过将校正信号重叠到调制信号中，可以成功补偿调制信号的变形。（4）我们已经成功补偿了调制信号的变形。（4）我们有到目前为止，已经观察到在实时主动调制电子显微镜下观察未染色的生物样品，并且已经观察到高对比度图像。但是，整个电子显微镜的稳定性已经逐渐恶化，这限制了高分辨率观察。

项目成果

T.Ando, H.Utsuro, T.Ikuta, Y.Kimura, Y.Takai and R.Shimizu: "A practical method for real-time active modulation electron microscopy-Optimization of driving-signal for active accelerating-voltage modulation." Optik. 104. 163-165 (1997)

T.Ando、H.Utsuro、T.Ikuta、Y.Kimura、Y.Takai 和 R.Shimizu：“实时主动调制电子显微镜的实用方法 - 主动加速电压调制的驱动信号优化。”

松尾 浩: "Development of a Nanoprobe Cathodoluminescence Scanning Electron Microscope" J Electron Microsc.Vol.45 No.5. 453-457 (1996)

Hiroshi Matsuo：“纳米探针阴极发光扫描电子显微镜的开发”J Electron Microsc.Vol.45 No.5 (1996)。

Y.Takai,N.Oba,T,Ando T,Ikuta and R.Shimizu: "Extraction of Spherical and Chromatic Aberration-free Information by Focal-depth Extension Processing UnderTilted Illumination" J.Electron Microscopy. 44. 8-14 (1995)

Y.Takai、N.Oba、T、Ando T、Ikuta 和 R.Shimizu：“通过倾斜照明下的焦深扩展处理提取无球差和色差信息”J.Electron Microscopy。

H.Matsuo, N.Kobayashi, Y.Kimura and R.Shimizu: "Development of a Nanoprobe Cathodeluminescence Scanning Electron Microscope" J.Electron Microsc.45. 453-457 (1996)

H.Matsuo、N.Kobayashi、Y.Kimura 和 R.Shimizu：“纳米探针阴极发光扫描电子显微镜的开发”J.Electron Microsc.45。