NSF-BSF: Electrical mitigation of radiation-induced defects in InAs/GaSb structures for infrared sensing

NSF-BSF:用于红外传感的 InAs/GaSb 结构中辐射引起的缺陷的电气缓解

基本信息

项目摘要

Infrared (IR) photodetectors have many security-related applications ranging from night-vision and large-scale fire alarm systems to IR-sensing in the hither cosmos for interceptor seekers and early missile warning systems. As a threat of terrorism is a part of every-day reality for the US and other countries, availability of efficient and radiation hard IR detector arrays will help protecting countries from terrorism, thus saving lives and assets. Damage by energetic particles degrades the sensitivity of IR photodetectors in harsh radiation environments. This project will lead to a dramatic recovery of photodetectors based on InAs/GaSb structures. This outcome will be achieved by electrical tailoring of a fundamental property of the material, the electron diffusion length, by in-situ charge injection under applied voltage. Photodetector sensitivity will recover completely and return to the original state prior to irradiation or even exceed it. The project will advance the fundamental understanding of the nature of point and extended defects in InAs/GaSb-based semiconductors and devices. The project will integrate research and education at the graduate and undergraduate levels and features an active international partner from Tel Aviv University in Israel.This project focuses on electrical mitigation of irradiation-induced defects by charge injection into infrared photodetectors based on InAs/GaSb superlattices. The ultimate aim is to produce radiation hard and efficient devices. The project hinges on the PI's previous findings that charge injection into InAs/GaSb type-II strained-layer superlattices leads to considerable changes in the material's electronic properties, particularly the carrier diffusion length. These changes result in a several fold enhancements of the photodetector quantum efficiency. It is therefore possible to improve performance of photodetectors, affected by radiation, using short pulses of solid-state forward-bias charge injection into InAs/GaSb p-i-n devices. The project will lead to a better understanding of the interaction between InAs and GaSb semiconductors and highly energetic particles, including electrons, gamma-ray photons, and protons, as well as of the nature of radiation-induced defects. Charge injection will result in enhanced minority electron diffusion length in the p-type absorption layer of a photodetector, thus increasing the quantum efficiency for the device and "healing" the adverse impact of gamma-rays, protons, electrons, and other radiation types. A unique combination of electrical and optical studies in the PI’s lab will shed light on the mechanism, which is responsible for the effect of interest. Studies of minority carrier diffusion length will be conducted using electron beam-induced current technique at various temperatures. Deep level transient spectroscopy will allow studies of radiation-induced point defects. Spectral photoresponse measurements will assess the impact of charge injection on device quantum efficiency. The ultimate goal is to correlate charge injection regimes (current; voltage; duration) and irradiation doses, thus proceeding towards control of photodetector performance and recovery from radiation damage by purely electrical means.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
红外线(IR)光电探测器有许多与安全相关的射程,从夜视和大规模的火灾警报到IR敏感性,以寻求拦截器和早期的导弹警告系统。对于美国和其他国家/地区,终端辐射硬质探测器阵列的可用性将保护国家免受Terom Orism的侵害,能量损坏会使IR光电探测器的敏感性在恶劣的辐射效果中降低。气体结构在基于INAS/GASB的半导体和设备中。在INAS/GASB上,最终的目标是硬有效的设备,该项目对INAS/GASB类型的II型超级峰值收取的效果会取决于材料的性质,尤其是载体的扩散长度。折叠式量子的量子量。 ,质子以及放射性诱导的电荷注射。和其他辐射评估电荷注入对设备量子效率的影响。使用基金会的知识分子优点和更广泛的影响标准,通过评估来剥夺支持的范围。

项目成果

期刊论文数量(0)
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会议论文数量(0)
专利数量(0)

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Leonid Chernyak其他文献

Forward bias annealing of proton radiation damage in NiO/Ga2O3 rectifiers
NiO/Ga2O3 整流器中质子辐射损伤的正向偏压退火
  • DOI:
  • 发表时间:
    2024
  • 期刊:
  • 影响因子:
    2.9
  • 作者:
    Jian;Chao;Hsiao;M. Rasel;A. Haque;Jihyun Kim;Fan Ren;Leonid Chernyak;S. Pearton
  • 通讯作者:
    S. Pearton

Leonid Chernyak的其他文献

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{{ truncateString('Leonid Chernyak', 18)}}的其他基金

Carrier recombination dynamics in III-N photodetectors
III-N 光电探测器中的载流子复合动力学
  • 批准号:
    2341747
  • 财政年份:
    2024
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Standard Grant
Electrical mitigation of radiation-induced defects in AlGaN/GaN photovoltaic detectors
AlGaN/GaN 光伏探测器中辐射引起的缺陷的电气缓解
  • 批准号:
    1802208
  • 财政年份:
    2018
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Standard Grant
MRI: Acquisition of a Cathodoluminescence Microscope for Device Testing, Materials Research and Education
MRI:购买阴极发光显微镜用于设备测试、材料研究和教育
  • 批准号:
    1624734
  • 财政年份:
    2016
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Standard Grant
Collaborative Research: Studies of Electron Injection-Induced Effects in ZnO-based Materials and Device Structures
合作研究:ZnO基材料和器件结构中电子注入诱导效应的研究
  • 批准号:
    0900971
  • 财政年份:
    2009
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Standard Grant
Studies of the Electron Injection-Induced Effects in III-Nitride Device Structures
III 族氮化物器件结构中电子注入诱导效应的研究
  • 批准号:
    0422604
  • 财政年份:
    2004
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Continuing Grant
MRI: Acquisition of a Cathodoluminescence System for Research in III-Nitride Nanostructures
MRI:获取用于研究 III 族氮化物纳米结构的阴极发光系统
  • 批准号:
    0216055
  • 财政年份:
    2002
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Standard Grant
SGER: New Approach to Revolutionize a Photovoltaic Detector Performance Using Electron Injection-Induced Effects in AlGaN
SGER:利用 AlGaN 中的电子注入感应效应彻底改变光伏探测器性能的新方法
  • 批准号:
    0219546
  • 财政年份:
    2002
  • 资助金额:
    $ 41.54万
  • 项目类别:
    Standard Grant

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