MRI: Acquisition of Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) for high resolution 3-D materials analysis

MRI：获取飞行时间二次离子质谱仪 (TOF-SIMS) 用于高分辨率 3D 材料分析

• 批准号: 1626418
• 负责人: Rafael Verduzco
• 金额: $ 116.62万
• 依托单位: William Marsh Rice University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2016
• 资助国家: 美国
• 起止时间: 2016-10-01 至 2021-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1626418&HistoricalAwards=false
• 关键词: MRI; Acquisition; Time; Flight; Secondary

1626418Verduzco, RafaelAll matter is made up of atoms, but determining the precise atomic structure of materials is a fundamental challenge across virtually all fields of scientific research. Knowledge of the atomic structure of materials provides clues to the history of the Earth, the complex chemistry of the environment, the development of technologies for energy storage, and the structure and function of biological systems. This project will provide detailed imaging and compositional analysis of a broad range of materials through the acquisition of a Time-of-Flight Secondary Ionization Mass Spectrometer (TOF-SIMS). TOF-SIMS is a powerful technique that can detect atoms across the entire periodic table and provide a three dimensional image of materials' atomic composition and structure. The TOF-SIMS instrument will serve a wide range of fields, ranging from the Earth and environmental sciences to the biomedical fields and have a direct impact on the technological innovation and competitiveness of local industry. The projects' intellectual merit crosses fields as diverse as geology, materials for energy storage and conversion, nanomaterials research, bioengineering research, organic and hybrid organic/inorganic thin films, and Earth sciences. The broader impacts include the creation of new educational programs and support of regional research institutions and industry. At present, the Houston area does not have TOF-SIMS capabilities. The instrument will be managed by Rice University's Shared Equipment Authority, making the instrumentation available to both on-campus and off-campus users. The instrument will serve as a venue for a number of educational opportunities either directly by providing training opportunities to students and researchers in the Houston area or indirectly by supporting the educational efforts of related projects. Annual TOF-SIMS user meetings will be organized by the PI and held at Rice University to exchange techniques and results on different samples, bring in new participants, and educate interested researchers. The PI will also establish a graduate-level course focused on TOF-SIMS analysis of materials in materials science, and the course will include a hands-on module for sample analysis and student training.Quantitative compositional and structural analysis from the nanoscale to the micron-scale is essential for advances in virtually all fields of scientific research. This project will establish a Time-of-Flight Secondary Ionization Mass Spectrometer (TOF-SIMS) at Rice University for elemental, molecular, and isotopic imaging of materials relevant to earth sciences, energy storage and conversion, environmental remediation, and biosciences. Secondary ion mass spectroscopy (SIMS) is a powerful technique that can provide elemental or isotopic mapping at the sub-micron level for a wide range of materials, and the use of a time-of-flight detector (TOF) enables full mass-spectrum analysis, including the capability to separate species that differ in mass by as little as 0.001 amu and for collecting a wide mass range from H to U and beyond. The instrument can image materials with sub-50 nm lateral resolution and perform depth profiling with sub-10 nm resolution, thereby enabling three-dimensional materials analysis. Altogether, a modern TOF-SIMS instrument provides the capabilities required to analyze surfaces, organic films, biological materials, trace metals, and other materials both in-depth and in three dimensions. The projects' intellectual merit crosses fields as diverse as Earth sciences, materials for energy storage and conversion, nanomaterials research, bioengineering research, and organic and hybrid organic/inorganic thin films. In the Earth sciences, TOF-SIMS will be applied to geologically-relevant materials to study pathways and kinetics by which elements are transported in geological processes and trace element partitioning in micro- and nano-phases in hydrothermal systems. In energy-related research, the three-dimensional structure of photovoltaic blends and composite electrodes will be elucidated through TOF-SIMS. TOF-SIMS will be used to quantify the growth and doping of two-dimensional materials. TOF-SIMS will also be critical to the study of nanoparticle transport and toxicity in biological systems, providing simultaneous imaging of trace elements intracellularly, allowing parallel CN, P, and Pb images. Finally, TOF-SIMS will provide nanoscale lateral and through-depth compositional analysis of thin film coatings. The proposed TOF-SIMS instrument will serve these and other research projects of interest to internal and external researchers in the Gulf Coast Region. The projects' broader impacts include fundamental advances in science and engineering research, support of local industry, and the creation of new educational activities. The acquisition represents the only TOF-SIMS instrument in the Gulf Coast region, and the instrument will be made available to regional research institutions and industry through Rice's Shared Equipment Authority. The TOF-SIMS at Rice will serve a wide range of fields, ranging from the Earth and environmental sciences to the biomedical fields and have a direct impact on the technological innovation and competitiveness of local industry. Educational activities include annual TOF-SIMS user meetings, a graduate-level course focused on TOF-SIMS analysis of materials in materials science, and hands-on training for summer students and researchers.

1626418 verduzco，拉斐尔物质是由原子组成的，但是确定材料的确切原子结构是几乎所有科学研究领域的基本挑战。材料原子结构的知识为地球历史，环境的复杂化学，能源存储技术的发展以及生物系统的结构和功能提供了线索。该项目将通过获取飞行时间二级电离质谱仪（TOF-SIMS）来提供广泛材料的详细成像和组成分析。 TOF-SIMS是一种强大的技术，可以检测整个元素周期表上的原子，并提供材料原子组成和结构的三维图像。 TOF-SIMS工具将为各种领域提供服务，从地球和环境科学到生物医学领域，并直接影响当地工业的技术创新和竞争力。这些项目的智力优点跨越了地质的多样化，能源储能和转换材料，纳米材料研究，生物工程研究，有机和混合有机/无机薄膜以及地球科学。更广泛的影响包括创建新的教育计划以及对区域研究机构和行业的支持。目前，休斯顿地区没有TOF-SIMS功能。该仪器将由赖斯大学的共享设备管理局管理，使仪器在校园和校外使用者中都可以使用。该工具将通过为休斯顿地区的学生和研究人员提供培训机会，或通过支持相关项目的教育工作来直接为许多教育机会提供培训机会。年度TOF-SIMS用户会议将由PI组织，并在赖斯大学举行，以交换不同样本的技术和结果，引入新的参与者，并教育感兴趣的研究人员。 PI还将建立一个专注于材料科学材料分析的研究生级课程，该课程将包括一个动手模块，用于样本分析和学生培训。从纳米级到微小尺度的质量组成和结构分析对于几乎所有科学研究领域的进步至关重要。该项目将在莱斯大学建立元素，分子和同位素成像的材料，与地球科学相关的材料，能源储能和转换，环境修复和生物科学的材料的飞行时间二级电离质谱仪（TOF-SIMS）。 Secondary ion mass spectroscopy (SIMS) is a powerful technique that can provide elemental or isotopic mapping at the sub-micron level for a wide range of materials, and the use of a time-of-flight detector (TOF) enables full mass-spectrum analysis, including the capability to separate species that differ in mass by as little as 0.001 amu and for collecting a wide mass range from H to U and beyond.该仪器可以用低于50 nm的横向分辨率对材料进行成像，并以低于10 nm的分辨率进行深度分析，从而实现三维材料分析。总的来说，一种现代的TOF-SIMS仪器提供了分析表面，有机膜，生物材料，微量金属和其他材料所需的功能。这些项目的智力优点跨越了地球科学，能源储能和转换材料，纳米材料研究，生物工程研究以及有机和混合有机/无机薄膜。在地球科学中，TOF-SIMS将应用于与地质相关的材料，以研究途径和动力学，通过这些途径和动力学，在水热系统中，在地质过程中运输元素，并在地质过程中运输元素和痕量元素分配。在与能源相关的研究中，将通过TOF-SIMS阐明光伏混合物和复合电极的三维结构。 TOF-SIMS将用于量化二维材料的生长和掺杂。 TOF-SIMS对于生物系统中纳米颗粒的转运和毒性的研究也至关重要，可在细胞内同时对痕量元件进行成像，从而允许并行CN，P和PB图像。 最后，TOF-SIMS将对薄膜涂层提供纳米级侧向和深度组成分析。拟议的TOF-SIMS工具将为墨西哥湾沿岸地区的内部和外部研究人员提供这些感兴趣的研究项目。这些项目的更广泛的影响包括科学和工程研究的基本进步，对本地工业的支持以及创建新的教育活动。此次收购代表了墨西哥湾沿岸地区唯一的TOF-SIMS仪器，该工具将通过Rice的共享设备权威向区域研究机构和行业提供。大米的TOF-SIMS将提供各种领域，从地球和环境科学到生物医学领域，并直接影响当地工业的技术创新和竞争力。 教育活动包括年度TOF-SIMS用户会议，一项研究生级课程，重点是材料科学材料的TOF-SIMS分析，以及针对暑期学生和研究人员的动手培训。