MRI: Acquisition of Raman-AFM-Lifetime System for Materials Research and Training

MRI：获取用于材料研究和培训的拉曼 AFM 寿命系统

• 批准号: 1428919
• 负责人: Igor Sokolov
• 金额: $ 63.46万
• 依托单位: Tufts University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2014
• 资助国家: 美国
• 起止时间: 2014-09-01 至 2017-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1428919&HistoricalAwards=false
• 关键词: MRI; Acquisition; Raman; AFM; Lifetime

PI: Sokolov, IgorProposal: 1428919Title: MRI: Acquisition of Raman-AFM-Lifetime System for Materials Research and TrainingSignificanceThe requested system has the ability to collect multiple parameters (using Raman, AFM and optical excitation) from the same area of the sample surface, opening the possibility for a better understanding of surface properties. The system has significant advantages over previous systems, including function-structure studies and uses a smaller amount of laser radiation, thus allowing the study of many organic samples in non-destructive way, and faster acquisition of Raman maps. This new version of confocal imaging Raman spectrometer allows collection of Raman spectra over a sample surface much faster than was previously possible. It opens a window of opportunities for both research and education. In addition to allowing studies of organic samples non-destructively, it will achieve faster acquisition of Raman maps allowing the use of the instrument for real-time demonstrations for students.Technical DescriptionThe state-of-the-art integrated Raman-AFM-Lifetime system by WITec Instruments Corp. (Alpha 300R+ Raman system) consists of three integrated parts: a Confocal Raman imaging spectrometer, an atomic force microscope (AFM), and a time-correlated single photon counter. It allows measuring a unique synergistic combination of material parameters, which makes this instrument a unique platform for a large number of potential applications and users. The instrument, hosted at the School of Engineering of Tufts University, will be used by researchers from multiple department and schools across Tufts University as well as outside researchers, including those from the Greater Boston Area (in which no similar instrument exists). The instrument gives the material and stress specific information (the Raman part), physical parameters (topography, electrical charges, viscoelastic moduli of the sample; the AFM part), and lifetime of optical excitation (the lifetime part). All these parameters are measured at the same location on the sample surface. Furthermore, the AFM part will substantially enhance the spatial resolution of the Raman mapping by using a combination with AFM through the tip-enhanced Raman spectroscopy (TERS). The option of single-photon sensitivity and ability to measure life-time of radiated light allow, for example, not only luminescent life-time mapping but also the separation of true Raman and (sometimes Raman-look) fluorescent signals, which is important for quantitative measurements.

PI：Sokolov，Igor提案：1428919标题：MRI：获取用于材料研究和培训的拉曼-AFM-寿命系统意义所请求的系统能够从样品表面的同一区域收集多个参数（使用拉曼、AFM和光学激发），为更好地了解表面特性提供了可能性。该系统比以前的系统具有显着的优势，包括功能结构研究和使用更少量的激光辐射，从而可以以非破坏性的方式研究许多有机样品，并更快地获取拉曼图。这种新版本的共焦成像拉曼光谱仪可以比以前更快地收集样品表面的拉曼光谱。它为研究和教育打开了一扇机会之窗。除了能够非破坏性地研究有机样品之外，它还能更快地获取拉曼图，从而允许使用该仪器为学生进行实时演示。技术说明最先进的集成拉曼-AFM-寿命系统WITec Instruments Corp. 的（Alpha 300R+ 拉曼系统）由三个集成部分组成：共焦拉曼成像光谱仪、原子力显微镜 (AFM) 和时间相关单光子计数器。它可以测量材料参数的独特协同组合，这使得该仪器成为大量潜在应用和用户的独特平台。该仪器由塔夫茨大学工程学院托管，将由塔夫茨大学多个系和学院的研究人员以及外部研究人员使用，包括来自大波士顿地区（该地区没有类似仪器）的研究人员。该仪器提供材料和应力的具体信息（拉曼部分）、物理参数（样品的形貌、电荷、粘弹性模量；AFM 部分）以及光学激发的寿命（寿命部分）。所有这些参数都是在样品表面的同一位置测量的。此外，AFM 部分将通过尖端增强拉曼光谱 (TERS) 与 AFM 结合使用，从而显着提高拉曼映射的空间分辨率。例如，单光子灵敏度和测量辐射光寿命的能力不仅可以进行发光寿命映射，还可以分离真正的拉曼信号和（有时是拉曼外观）荧光信号，这对于定量测量。

项目成果

Absorption of organic compounds by mesoporous silica discoids

• DOI: 10.1016/j.micromeso.2020.110379
• 发表时间: 2020-10
• 期刊: Microporous and Mesoporous Materials
• 影响因子: 5.2
• 作者: S. Palantavida;Berney Peng;I. Sokolov

Ultrabright Fluorescent Silica Nanoparticles for Multiplexed Detection

• DOI: 10.3390/nano10050905
• 发表时间: 2020-05-01
• 期刊: NANOMATERIALS
• 影响因子: 5.3
• 作者: Peerzade, Saquib Ahmed M. A.;Makarova, Nadezda;Sokolov, Igor
• 通讯作者: Sokolov, Igor

Can AFM be used to measure absolute values of Young's modulus of nanocomposite materials down to the nanoscale?

AFM 能否用于测量纳米复合材料杨氏模量的绝对值直至纳米尺度？

• DOI: 10.1039/d0nr02314k
• 发表时间: 2020-06-21
• 期刊: NANOSCALE
• 影响因子: 6.7
• 作者: Liu, Yuke;Sokolov, Igor;Peng, Ping'an
• 通讯作者: Peng, Ping'an