Dynamics and Kinetics of Pulsed Laser Deposition: Time-Resolved Synchrotron X-ray Studies

脉冲激光沉积的动力学和动力学：时间分辨同步加速器 X 射线研究

• 批准号: 0705361
• 负责人: Joel Brock
• 金额: $ 39万
• 依托单位: Cornell University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-06-01 至 2011-05-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0705361&HistoricalAwards=false
• 关键词: Dynamics; Kinetics; Pulsed; Laser; Deposition

Non-Technical AbstractThis project will use time-resolved, x-ray techniques to characterize the atomic scale processes governing the growth of thin-films via pulsed laser deposition (PLD). Due to the atomic nature of materials, attaining the ultimate in device performance is expected to require atomic-level precision in the preparation of surfaces and interfaces. The properties of oxide films are very sensitive to oxygen content. For example, a small increase in oxygen concentration changes strontium titanate films from an insulator into a semiconductor and then into a metal. Developing the ability to control and confine oxygen vacancies remains an important barrier to realizing the full potential of oxide electronic devices. This project will develop and explore the potential of a new technique (time-resolved diffuse x-ray scattering) to characterize oxygen vacancies in such films during their preparation. This project will support intensive training in advanced synchrotron-based x-ray techniques and in the growth of complex oxide thin-films by PLD to a graduate student and a post-doctoral research associate. The PI will continue to work with elementary and middle school teachers on projects developing hands-on modules tailored to meet the goals of the NY state mandated physics curriculum and to disseminate these materials at in-service teacher training events.Technical AbstractThis project will use time-resolved, synchrotron-based, hard x-ray (10 KeV) techniques to characterize the atomic scale processes governing the growth of thin-films via pulsed laser deposition (PLD). This project will explore the potential of using the diffuse x-ray scattering from the long-range strain fields of point defects (Huang scattering) to characterize the concentration, spatial distribution, symmetry, and anticipated clustering of oxygen vacancies in SrTiO3 films deposited via PLD. In contrast to spectroscopic techniques which are sensitive to the concentration of atoms or molecules, diffuse x-ray scattering is directly sensitive to the vacancy concentration. This project will support intensive training in advanced synchrotron-based x-ray techniques and in the growth of complex oxide thin-films by PLD to a graduate student and a post-doctoral research associate. The PI will continue to work with elementary and middle school teachers on projects developing hands-on modules tailored to meet the goals of the NY state mandated physics curriculum and to disseminate these materials at in-service teacher training events.

非技术摘要该项目将使用时间分辨 X 射线技术来表征通过脉冲激光沉积 (PLD) 控制薄膜生长的原子级过程。由于材料的原子性质，要获得最终的器件性能，预计需要在表面和界面的制备中达到原子级的精度。氧化膜的性能对氧含量非常敏感。例如，氧浓度的小幅增加会使钛酸锶薄膜从绝缘体转变为半导体，然后转变为金属。发展控制和限制氧空位的能力仍然是实现氧化物电子器件全部潜力的重要障碍。该项目将开发和探索新技术（时间分辨漫射 X 射线散射）的潜力，以表征此类薄膜在制备过程中的氧空位。该项目将支持对研究生和博士后研究员进行先进同步加速器 X 射线技术和 PLD 复合氧化物薄膜生长方面的强化培训。 PI 将继续与中小学教师合作开发实践模块的项目，以满足纽约州强制物理课程的目标，并在在职教师培训活动中传播这些材料。技术摘要该项目将使用时间-基于同步加速器的分辨硬 X 射线 (10 KeV) 技术，通过脉冲激光沉积 (PLD) 来表征控制薄膜生长的原子级过程。该项目将探索利用点缺陷长程应变场（Huang 散射）的漫射 X 射线散射来表征通过 PLD 沉积的 SrTiO3 薄膜中氧空位的浓度、空间分布、对称性和预期聚集的潜力。 。 与对原子或分子浓度敏感的光谱技术相反，漫射 X 射线散射对空位浓度直接敏感。 该项目将支持对研究生和博士后研究员进行先进同步加速器 X 射线技术和 PLD 复合氧化物薄膜生长方面的强化培训。 PI 将继续与中小学教师合作开发实践模块的项目，以满足纽约州规定的物理课程的目标，并在在职教师培训活动中传播这些材料。