Dynamics and Kinetics of Pulsed Laser Deposition: Time-Resolved Synchrotron X-ray Studies

脉冲激光沉积的动力学和动力学：时间分辨同步加速器 X 射线研究

• 批准号: 0705361
• 负责人: Joel Brock
• 金额: $ 39万
• 依托单位: Cornell University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-06-01 至 2011-05-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0705361&HistoricalAwards=false
• 关键词: Dynamics; Kinetics; Pulsed; Laser; Deposition

Non-Technical AbstractThis project will use time-resolved, x-ray techniques to characterize the atomic scale processes governing the growth of thin-films via pulsed laser deposition (PLD). Due to the atomic nature of materials, attaining the ultimate in device performance is expected to require atomic-level precision in the preparation of surfaces and interfaces. The properties of oxide films are very sensitive to oxygen content. For example, a small increase in oxygen concentration changes strontium titanate films from an insulator into a semiconductor and then into a metal. Developing the ability to control and confine oxygen vacancies remains an important barrier to realizing the full potential of oxide electronic devices. This project will develop and explore the potential of a new technique (time-resolved diffuse x-ray scattering) to characterize oxygen vacancies in such films during their preparation. This project will support intensive training in advanced synchrotron-based x-ray techniques and in the growth of complex oxide thin-films by PLD to a graduate student and a post-doctoral research associate. The PI will continue to work with elementary and middle school teachers on projects developing hands-on modules tailored to meet the goals of the NY state mandated physics curriculum and to disseminate these materials at in-service teacher training events.Technical AbstractThis project will use time-resolved, synchrotron-based, hard x-ray (10 KeV) techniques to characterize the atomic scale processes governing the growth of thin-films via pulsed laser deposition (PLD). This project will explore the potential of using the diffuse x-ray scattering from the long-range strain fields of point defects (Huang scattering) to characterize the concentration, spatial distribution, symmetry, and anticipated clustering of oxygen vacancies in SrTiO3 films deposited via PLD. In contrast to spectroscopic techniques which are sensitive to the concentration of atoms or molecules, diffuse x-ray scattering is directly sensitive to the vacancy concentration. This project will support intensive training in advanced synchrotron-based x-ray techniques and in the growth of complex oxide thin-films by PLD to a graduate student and a post-doctoral research associate. The PI will continue to work with elementary and middle school teachers on projects developing hands-on modules tailored to meet the goals of the NY state mandated physics curriculum and to disseminate these materials at in-service teacher training events.

非技术抽象项目将使用时间分辨的X射线技术来表征通过脉冲激光沉积（PLD）来控制薄膜生长的原子量表过程。由于材料的原子性质，在制备表面和界面时，预期达到设备性能的最终性能需要原子级的精度。氧化膜的特性对氧含量非常敏感。例如，氧气浓度的少量升高将钛酸斜膜从绝缘体变成半导体，然后变成金属。开发控制和限制氧气空位的能力仍然是实现氧化物电子设备的全部潜力的重要障碍。该项目将开发并探索新技术（时间分辨X射线散射）的潜力，以表征此类膜在制备过程中的氧空位。该项目将支持基于高级同步加速器的X射线技术的深入培训，以及PLD对研究生和博士后研究助理的复杂氧化物薄膜的增长。 The PI will continue to work with elementary and middle school teachers on projects developing hands-on modules tailored to meet the goals of the NY state mandated physics curriculum and to disseminate these materials at in-service teacher training events.Technical AbstractThis project will use time-resolved, synchrotron-based, hard x-ray (10 KeV) techniques to characterize the atomic scale processes governing the growth of thin-films via pulsed激光沉积（PLD）。该项目将探索使用从点缺陷（黄散射）的远距离应变场（Huang散射）的漫射X射线散射来表征浓度，空间分布，对称性和预期的氧气空位聚集的SRTIO3膜中氧气空位的聚类。 与对原子或分子浓度敏感的光谱技术相反，弥散的X射线散射对空位浓度直接敏感。 该项目将支持基于高级同步加速器的X射线技术的深入培训，以及PLD对研究生和博士后研究助理的复杂氧化物薄膜的增长。 PI将继续与小学和中学教师合作，开发量身定制的动手模块，以实现纽约州强制性物理课程的目标，并在服务的教师培训活动中分发这些材料。