Development of an HREELS Analysis System for the Study of Polymers, Semiconductors, and Metal-Oxides

开发用于研究聚合物、半导体和金属氧化物的 HREELS 分析系统

• 批准号: 9303459
• 负责人: John Vohs
• 金额: $ 8.3万
• 依托单位: University of Pennsylvania
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-07-01 至 1995-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9303459&HistoricalAwards=false
• 关键词: Development; HREELS; Analysis; System; Study

This project is for the development of a surface analysis system equipped with latest generation high resolution electron energy loss (HREEL) spectrometer. This instrument is capable of an increased signal of at least 20 times for a fixed energy resolution and 5 times better energy resolution compared to other available spectrometers. These improvements will allow HREELS to be applied to the characterization of the vibrational properties of the surfaces and interfaces of a variety of technologically important materials, including, polymers, semiconductors, and metal oxides, at a new level of detail. The projects for which the spectrometer will initially be used include the molecular characterization of polymer surfaces and interfaces, semiconductor surface and interface dynamics, and reactivity of metal oxide surfaces.

该项目旨在开发配备最新一代高分辨率电子能量损失（HREEL）光谱仪的表面分析系统。 与其他可用的光谱仪相比，该仪器能够将固定能量分辨率的信号提高至少 20 倍，并且能量分辨率提高 5 倍。 这些改进将使 HREELS 能够以新的细节水平应用于表征各种技术上重要的材料（包括聚合物、半导体和金属氧化物）的表面和界面的振动特性。 光谱仪最初使用的项目包括聚合物表面和界面的分子表征、半导体表面和界面动力学以及金属氧化物表面的反应性。