PFI-RP: Measurement system for high speed and precision manufacturing

PFI-RP：用于高速精密制造的测量系统

• 批准号: 1918260
• 负责人: Rongguang Liang
• 金额: $ 55万
• 依托单位: University of Arizona
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2019
• 资助国家: 美国
• 起止时间: 2019-07-01 至 2023-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1918260&HistoricalAwards=false
• 关键词: PFI; RP; Measurement; system; speed

The broader impact/commercial potential of this Partnerships for Innovation-Research Partnerships (PFI-RP) project is the development and commercialization of an on-machine measurement (also called metrology) system that can increase the economic competitiveness of the United States in precision manufacturing, or the ability to machine complex components and parts with low margins for error. This project will enhance the ability to efficiently machine highly engineered parts, solving a common costly and labor-intensive technical hurdle facing many industries including optics, additive or 3D manufacturing, and other sectors with highly demanding machining requirements. This project will also create new and broader collaborations with industry, enhance partnerships between academia and industry, and build infrastructure for research and education. The proposed activities will provide next generation leaders in innovation and entrepreneurship with firsthand experience in technology development, translation, and commercialization. In addition, this work will expand the participation of women and students from underrepresented groups in innovation, technology translation, and entrepreneurship. The proposed project is expected to advance high-throughput precision manufacturing. Currently the key technical bottleneck in diamond turning and other high-precision fabrication is the metrology process used for quality control. Existing practices to center a tool and to ensure the quality of the fabricated workpiece are very time-consuming, requiring several iterations to remove the workpiece from the machine for offline measurements and then to remount workpiece onto the machine. The removal and remount processes often introduce additional manufacturing errors. The proposed compact, snapshot, dual-mode, multi-wavelength interferometric system will incorporate several unique techniques to significantly improve speed and manufacturing accuracy. Specifically, a polarization-based multi-wavelength snapshot technique will enable the real-time measurement of machined surfaces with minimum environmental impact. A deep-learning-based phase unwrapping technique will eliminate the time-consuming phase unwrapping problem in interferometric measurement. The unique configuration ensures a very compact interferometric system that can be integrated seamlessly into existing equipment for in-situ metrology. The new fabrication process with real-time, in-situ metrology is estimated to improve efficiency by 30% or greater in tool alignment, and another 50% or greater in surface metrology.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

这种合作伙伴关系对创新研究合作伙伴关系（PFI-RP）项目的更广泛的影响/商业潜力是开发和商业化机器测量（也称为计量学）系统，该系统可以提高美国在精确制造中的经济竞争力，或者具有较低利润率的机器复杂组件和零件的能力。 该项目将增强有效加工高度工程零件的能力，解决许多行业面临的常见昂贵且劳动力密集的技术障碍，包括光学，增材或3D制造业以及其他要求高度要求的加工要求的行业。 该项目还将与行业建立新的，更广泛的合作，增强学术界与行业之间的伙伴关系，并为研究和教育建立基础设施。拟议的活动将为下一代领导者提供创新和企业家精神，并在技术开发，翻译和商业化方面拥有第一手的经验。此外，这项工作将扩大代表性不足团体创新，技术翻译和企业家精神的妇女和学生的参与。 拟议的项目有望推进高通量精度制造。 目前，钻石转弯和其他高精度制造的关键技术瓶颈是用于质量控制的计量过程。现有的实践来集中工具并确保制造工件的质量非常耗时，需要几次迭代才能从机器上删除工件以进行离线测量，然后将工件重新安装到机器上。拆卸和重新安装过程通常会引入其他制造错误。提出的紧凑，快照，双模式，多波长干涉系统将结合几种独特的技术，以显着提高速度和制造精度。具体而言，基于极化的多波长快照技术将实现对加工表面的实时测量，并具有最小的环境影响。基于深度学习的相位解开技术将消除干涉测量中的时间耗时的相结合问题。独特的配置确保了一个非常紧凑的干涉系统，可以将其无缝集成到现有的原位计量设备中。具有实时，原位计量学的新制造过程估计可以提高效率30％或更高的工具对齐方式，而在表面计量学上则另外50％或更高。该奖项反映了NSF的法定任务，并被认为是值得通过基金会的知识分子优点和更广泛影响的审查标准来通过评估来获得支持的。

项目成果

Generalized elliptical retarder design and construction using nematic and cholesteric phase liquid crystal polymers

使用向列相和胆甾相液晶聚合物的广义椭圆延迟器设计和构造

• DOI: 10.1364/oe.456874
• 发表时间: 2022
• 期刊: Optics Express
• 影响因子: 3.8
• 作者: Miller, Sawyer;Jiang, Linan;Pau, Stanley
• 通讯作者: Pau, Stanley

Compact snapshot multiwavelength interferometer

紧凑型快照多波长干涉仪

• DOI: 10.1364/ol.44.004463
• 发表时间: 2019-09-15
• 期刊: OPTICS LETTERS
• 影响因子: 3.6
• 作者: Wang, Daodang;Tian, Xiaobo;Liang, Rongguang
• 通讯作者: Liang, Rongguang

Patterned liquid crystal polymer C-plate retarder and color polarizer

图案化液晶聚合物C板延迟片和彩色偏光片

• DOI: 10.1364/ao.416845
• 发表时间: 2021
• 期刊: Applied optics
• 影响因子: 1.9
• 作者: Sawyer Miller, Linan Jiang

Compact snapshot dual-mode interferometric system for on-machine measurement

用于机上测量的紧凑型快照双模干涉系统

• DOI: 10.1016/j.optlaseng.2020.106129
• 发表时间: 2020
• 期刊: Optics and Lasers in Engineering
• 影响因子: 4.6
• 作者: Wang Daodang;Fu Xiangyu;Xu Ping;Tian Xiaobo;Spires Oliver;Liang Jian;Wu Heng;Liang Rongguang
• 通讯作者: Liang Rongguang

Birefringent coating to remove polarization aberrations

双折射涂层可消除偏振像差

• DOI: 10.1364/oe.458859
• 发表时间: 2022
• 期刊: Optics Express
• 影响因子: 3.8
• 作者: Miller, Sawyer;Jiang, Linan;Pau, Stanley
• 通讯作者: Pau, Stanley