STTR Phase I: Snapshot, on-machine metrology system for high-precision optical manufacturing

STTR 第一阶段：用于高精度光学制造的快照机上测量系统

• 批准号: 2322208
• 负责人: Rongguang Liang
• 金额: $ 27.45万
• 依托单位: LIGHT RESEARCH INC
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2024
• 资助国家: 美国
• 起止时间: 2024-10-01 至 2025-09-30
• 项目状态: 未结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=2322208&HistoricalAwards=false
• 关键词: STTR; Phase; Snapshot; machine; metrology

The broader/commercial impact of this Small Business Technology Transfer (STTR) Phase I project advances precision manufacturing. The on-machine metrology system will have a transformative effect on highly efficient and precise optical manufacturing, additive manufacturing, and precision machining. These industries currently face a shared technical challenge: the lack of real-time quality control during fabrication. The on-machine metrology tool's real-time quality control capabilities will not only drive efficiency in high-precision manufacturing but also contribute to reduced manufacturing costs and enhanced product quality. Overall, the project's anticipated outcomes include an efficient high throughput manufacturing process with on-machine metrology, the development of a compact, snapshot, multi-wavelength on-machine metrology system, and the establishment of a next-generation innovation and entrepreneurship training program. This STTR project seeks to develop a compact, snapshot, dual-mode, multi-wavelength interferometric system for in situ metrology in high precision manufacturing. The lack of real-time quality control during fabrication is a critical hurdle, leading to delays and manufacturing errors. This system integrates unique techniques to overcome this challenge and enhance throughput and accuracy. The technology utilizes a polarization-based, multi-wavelength, snapshot technique providing real-time measurements of machined surfaces with minimal environmental impacts. By offering instant feedback on surface quality, reducing iterations for diamond tool centering, and improving throughput and accuracy, the system becomes the smallest interferometric system suitable for integration into existing equipment for in situ metrology. The project's goal is to develop a market-ready, on-machine metrology system through prototyping, software development, and performance validation. This real-time, in-situ metrology process is estimated to achieve efficiency improvements of 30% or more in diamond-tool alignment and 50% or more in surface metrology. Successful development and commercialization of this system will hold significant intellectual merit, overcoming a critical hurdle in high-precision manufacturing and enabling real-time quality control.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

该小型企业技术转让 (STTR) 第一阶段项目的更广泛/商业影响推动了精密制造的发展。机上测量系统将对高效精密光学制造、增材制造和精密加工产生变革性影响。这些行业目前面临着共同的技术挑战：制造过程中缺乏实时质量控制。 机上计量工具的实时质量控制功能不仅可以提高高精度制造的效率，还有助于降低制造成本并提高产品质量。总体而言，该项目的预期成果包括采用机上计量的高效高通量制造工艺、开发紧凑型快照式多波长机上计量系统以及建立下一代创新创业培训计划。该 STTR 项目旨在开发一种紧凑、快照、双模、多波长干涉测量系统，用于高精度制造中的原位计量。制造过程中缺乏实时质量控制是一个关键障碍，会导致延误和制造错误。该系统集成了独特的技术来克服这一挑战并提高吞吐量和准确性。该技术采用基于偏振的多波长快照技术，可对加工表面进行实时测量，同时将环境影响降至最低。通过提供表面质量的即时反馈、减少金刚石工具定心的迭代次数以及提高产量和精度，该系统成为适合集成到现有现场计量设备中的最小干涉测量系统。该项目的目标是通过原型设计、软件开发和性能验证来开发市场就绪的机上计量系统。这种实时原位计量流程预计可将金刚石工具对准效率提高 30% 或更多，将表面计量效率提高 50% 或更多。该系统的成功开发和商业化将具有重大的智力价值，克服高精度制造的关键障碍并实现实时质量控制。该奖项反映了 NSF 的法定使命，并通过使用基金会的智力价值进行评估，被认为值得支持以及更广泛的影响审查标准。