Frontiers of Electron Microscopy in Materials Science (FEMMS) Conference; Berkeley, CA; October 5-10, 2003

材料科学电子显微镜前沿 (FEMMS) 会议；

• 批准号: 0336677
• 负责人: David Williams
• 金额: $ 0.7万
• 依托单位: Lehigh University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2003
• 资助国家: 美国
• 起止时间: 2003-07-01 至 2004-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0336677&HistoricalAwards=false
• 关键词: Frontiers; Electron; Microscopy; Materials; Science

The grant supports the conference on electron microscopy to be held in Berkeley, CA from Oct. 5 -10, 2003. This biannual conference has been a regular feature of the microscopy world since 1986 with focus on the latest techniques, instrumentation and theories. This particular symposium is timely with emphasis on the current interest and application of electron microscopy in nano and bio technologies as well as recent applications for in-situ studies with time-resolved microscopies. New techniques of sample preparation such as FIB, and computer control of transmission electron microscopies removed long standing barriers in extending these techniques for teaching both in-class and with remote control over the internet, and these new advances will be discussed in the symposium that should be of interest to young researchers and students.A large number of international experts in electron microscopy will be presenting invited talks on the recent advances. Funds from NSF augment the commitment of several national laboratories and instrumentation companies to assist the attendance of several speakers and to offer financial aid to young US researchers in the field.

该赠款支持将于 2003 年 10 月 5 日至 10 日在加利福尼亚州伯克利举行的电子显微镜会议。自 1986 年以来，这一两年一度的会议一直是显微镜界的常规活动，重点关注最新的技术、仪器和理论。这次特别的研讨会恰逢其时，重点讨论电子显微镜在纳米和生物技术中的当前兴趣和应用，以及时间分辨显微镜原位研究的最新应用。样品制备新技术，如 FIB 和透射电子显微镜的计算机控制，消除了将这些技术扩展到课堂教学和互联网远程控制方面长期存在的障碍，这些新进展将在研讨会上讨论，众多电子显微镜领域的国际专家将受邀就最新进展发表演讲。 NSF 的资金增强了多个国家实验室和仪器公司的承诺，以协助多位演讲者出席并为该领域的年轻美国研究人员提供经济援助。