MRI: Acquisition of a Transmission Electron Microscope for Multi-disciplinary Research and Education

MRI：购买透射电子显微镜用于多学科研究和教育

• 批准号: 0216308
• 负责人: Ashok Kumar
• 金额: $ 41.42万
• 依托单位: University of South Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2002
• 资助国家: 美国
• 起止时间: 2002-09-01 至 2005-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0216308&HistoricalAwards=false
• 关键词: MRI; Acquisition; Transmission; Electron; Microscope

This Major Research Instrumentation (MRI) award is to purchase a fully analytical JEM-2010 transmission electron microscope (TEM). The JEM-2010 is a multipurpose high-resolution analytical microscope with wide range of capabilities, such as high-resolution image observation, microarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. The primary TEM system will comprise: (i) a TEM with a high resolution pole piece for high resolution electron microscopy imaging (HREM) and convergent beam electron diffraction (CBED), (ii) a scanning transmission electron microscopy (STEM) accessory, (iii) an energy dispersive X-ray spectrometer (EDS), (iv) an electron energy loss spectrometer (EELS) with an energy filter, and (v) a multichannel analyzer and support computers for data acquisition, storage, and processing. This instrument is capable of high spatial resolution imaging of crystalline and amorphous structures, small-beam electron diffraction, and compositional and spectroscopic analyses of micro-and nano-scale features, all necessary tools for characterizing materials structure. Numerous new scientific investigations will be enabled with the new equipment. This instrument will support research in a variety of materials systems including nanomaterials, semiconductors, ceramics, metals, polymers, biomaterials and mesoporous materials. The proposed research projects cover a broad area of research related to synthesis and characterization of high-performance materials for manufacturing applications and TEM will provide an opportunity to conduct high-quality research to understand the microstructural properties of the materials.The proposed TEM instrument will not only stimulate the productivity of the existing research projects related to the characterization of materials but also will be used for educational purposes. The instrument will be used in undergraduate and graduate courses, and in outreach program for minority students from local schools. It will thus allow for research training of future scientists and engineers from diverse backgrounds in current techniques of electron microscopy and state-of-the-art instrumentation. A laboratory course will be introduced and the main purpose is to provide students hands-on experience starting from sample preparations to operations of TEM. Support for a TEM instrument will also allow the development and enhancement of creative partnership with the numerous local industries, including microelectronics manufacturing, optical coating manufacturing, biomedical company, and computer hardware company. Results of the project will be disseminated by paper presentation in regional and national conferences, and published in journals.

这项主要的研究仪器（MRI）奖是购买完全分析的JEM-2010传输电子显微镜（TEM）。 JEM-2010是一种多功能高分辨率分析显微镜，具有广泛的功能范围，例如高分辨率图像观察，微区域X射线分析，通过收敛梁电子衍射进行的多功能分析以及原子结构和/或或/或或/或分析原子的粘结状态。主要TEM系统将包含：（i）具有高分辨率电子显微镜成像（HREM）和收敛束电子衍射（CBED），（ii）扫描传输电子显微镜（STEM）附件的TEM，（ii）（ii） iii）能量色散X射线光谱仪（EDS），（iv）带有能量滤波器的电子能量损失仪（EEL），以及（v）多通道分析仪和支持计算机，用于数据采集，存储和处理。该仪器能够对晶体和无定形结构，小束电子衍射以及微型和纳米尺度特征的组成和光谱分析进行高空间分辨率成像，所有这些都是表征材料结构的必要工具。 新设备将实现许多新的科学研究。该仪器将支持在各种材料系统中的研究，包括纳米材料，半导体，陶瓷，金属，聚合物，生物材料和介孔材料。拟议的研究项目涵盖了与制造应用高性能材料的合成和表征有关的广泛研究领域，TEM将为进行高质量研究以了解材料的微观结构特性。仅刺激与材料表征相关的现有研究项目的生产力，但也将用于教育目的。 该仪器将用于本科和研究生课程，以及针对当地学校的少数族裔学生的外展计划。因此，它将允许对来自电子显微镜和最先进仪器技术技术的不同背景的未来科学家和工程师进行研究培训。将引入实验室课程，主要目的是为学生提供从样本准备工作到TEM运营的实践经验。对TEM仪器的支持还将允许与众多本地行业（包括微电子制造，光涂层制造，生物医学公司和计算机硬件公司）开发和增强创意合作伙伴关系。该项目的结果将通过区域和民族会议上的纸张介绍传播，并在期刊上发表。