Acquisition of High Resolution X-Ray Diffractometer for Materials Research

购置高分辨率 X 射线衍射仪用于材料研究

• 批准号: 9871338
• 负责人: David Wu
• 金额: $ 17万
• 依托单位: Yale University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1999
• 资助国家: 美国
• 起止时间: 1999-01-01 至 2000-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9871338&HistoricalAwards=false
• 关键词: Acquisition; Resolution; Ray; Diffractometer; Materials

ABSTRACT CTS-9871338 David T. Wu, Louis J. Guido, Gary L. Povirk Yale University Title: Acquisition of High Resolution X-Ray Diffractometer for Materials Research The departments of Mechanical and Electrical Engineering at Yale University will purchase a Philips X'PERT Materials Research Diffractometer system with a wide range of options. Cost-sharing of over 47% is provided by the university. The primary uses will be in materials science projects, including Synthesis of Semiconductor Thin Films, Material Length Scales in Metal Plasticity, and Dynamics of Grain Growth. The equipment will be used also to enhance the teaching of materials science.

摘要CTS-9871338 David T. Wu，Louis J. Guido，Gary L. Povirk Yale University标题：耶鲁大学机械和电气工程的高分辨率X射线衍射仪的收购将购买菲利普斯X'pert材料研究衍射仪研究的机械和电气工程部门，具有广泛的选择范围。大学提供的成本分布超过47％。主要用途将用于材料科学项目，包括合成半导体薄膜，金属可塑性的材料长度和谷物生长动力学。该设备还将用于增强材料科学的教学。