Chemical Analysis of Surfaces by Correlated TOF-SIMS and XPS

通过相关 TOF-SIMS 和 XPS 进行表面化学分析

• 批准号: 9631702
• 负责人: Julia Fulghum
• 金额: $ 5.97万
• 依托单位: Kent State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1996
• 资助国家: 美国
• 起止时间: 1996-07-01 至 1998-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9631702&HistoricalAwards=false
• 关键词: Chemical; Analysis; Surfaces; Correlated; TOF

This project involves a Career Advancement Award to Julia E. Fulghum, Associate Professor of Chemistry at Kent State University. The PI is a recognized expert in X-ray Photoelectron Spectroscopy (XPS) and the purpose of this award is to enable her to spend a sabbatical leave at the National Renewable Energy Laboratory (NREL) in Denver, Colorado, to learn sample preparation and data analysis for time-of-flight secondary ion mass spectrometry (TOF-SIMS). Both XPS and TOF-SIMS are surface analysis techniques and the information they provide is complimentary. The PI will be able to expand her XPS technique development to encompass TOF-SIMS imaging with emphasis on organic and insulating samples. Part of the work at NREL will involve studies on photovoltaic materials development. In addition, the PI will be able to add TOF-SIMS capability to her on-going research work on the surface chemistry of materials. The long-term goal is to add TOF-SIMS instrumentation capability in her own laboratory. The project is supported by the Analytical and Surface Chemistry Program and the Special Projects Office in the Chemistry Division. This project will enable Professor Julia E. Fulghum to examine the surface chemistry of important technological materials such as liquid crystals and photovoltaics using two complementary techniques: X-ray photoelectron spectroscopy and time-of-flight-secondary ion mass spectrometry. Little work is available in the literature regarding such a comparison. Imaging is one aspect of the work and correlating information from both techniques will aid in understanding the artifacts and limitations of each of them. The results of the work will contribute to the development of solar cells for energy conversion and the technology of optical materials.

该项目向肯特州立大学化学副教授 Julia E. Fulghum 颁发了职业发展奖。 该 PI 是 X 射线光电子能谱 (XPS) 领域公认的专家，该奖项的目的是让她能够在科罗拉多州丹佛市的国家可再生能源实验室 (NREL) 休假，学习样品制备和数据飞行时间二次离子质谱 (TOF-SIMS) 分析。 XPS 和 TOF-SIMS 都是表面分析技术，它们提供的信息是免费的。 PI 将能够扩展其 XPS 技术开发，涵盖 TOF-SIMS 成像，重点关注有机和绝缘样品。 NREL 的部分工作将涉及光伏材料开发研究。 此外，PI 将能够将 TOF-SIMS 功能添加到她正在进行的材料表面化学研究工作中。 长期目标是在她自己的实验室中增加 TOF-SIMS 仪器能力。 该项目得到了分析和表面化学项目以及化学司特别项目办公室的支持。 该项目将使 Julia E. Fulghum 教授能够使用 X 射线光电子能谱和飞行时间二次离子质谱这两种互补技术来检查液晶和光伏等重要技术材料的表面化学。 文献中关于这种比较的工作很少。 成像是工作的一个方面，将这两种技术的信息关联起来将有助于理解每种技术的伪影和局限性。 该工作成果将有助于能量转换太阳能电池和光学材料技术的发展。