IVEM OPERATION AND IMPROVEMENTS

IVEM 运营和改进

• 批准号: 8172276
• 负责人: MICHAEL MARKO
• 金额: $ 2.16万
• 依托单位: WADSWORTH CENTER
• 依托单位国家: 美国
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-04-07 至 2011-01-31
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/8172276
• 关键词: Aging; Automation; Cathodes; Computer Retrieval of Information on Scientific Projects Database; Computer software; Computers; Data Collection; Dose; Electrons; Freezing; Funding; Gold; Grant; Image; Institution; Mus; Procedures; Reporting; Research; Research Personnel; Resolution; Resources; Rotation; Series; Services; Site; Source; Specimen; Spectrum Analysis; Staging; System; Testing; United States National Institutes of Health; Vision; Work; Writing; abstracting; charge coupled device camera; digital; electron tomography; high voltage electron microscopy; member; operation; stem

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. ABSTRACT: The IVEM (JEOL JEM-4000FX) is primarily used for TRD1, electron tomography of frozen- hydrated specimens. The IVEM is equipped with a LaB6 cathode, a 5-axis computer-controlled goniometer, and several double-tilt and tilt-rotation specimen stages, as well as Gatan single-tilt and tilt-rotation cryo-transfer stages. In 2002, we completed installation of a Gatan GIF2002 post-column energy filter equipped with a 2048x2048 CCD camera, and a TVIPS FastScan TV-rate CCD camera was installed for tracking beam-sensitive specimens at very low electron dose. Automated electron tomography is provided via external computer control. The instrumental resolution is 0.14 nm (gold lattice). The STEM-mode point-to-point resolution is 1 nm. Full analytical capability is provided, including EELS and EDX. Activity in past reporting period: The aging Emispec ES Vision STEM imaging and EDX/EELS spectroscopy system was replaced with a 4pi "Revolution" system. This was necessary because Emispec no longer exists, and service on the units is no longer available. We took this opportunity to consolidate all EM control software on a new, single computer. We installed the latest versions of the Gatan and Tietz imaging software. We re-wrote our automation system for collecting tomographic tilt-series images, since the old version was built on the Emispec system. The new version is completely stand-alone. It has a much easier-to-use interface with the Gatan energy filter and CCD imaging, via internal direct commands to Gatan Digital Micrograph. All EM control and imaging can now be done from the same application window, and the number of mouse needed for data collection has been reduced. The new software was written by Dean Leith. It was necessary to do this, rather than simply implementing Serial EM or another more-modern data-collection system, because the specimen stage of the JEM-4000 is not as eucentric as that of more modern TEMs, requiring a more-complicated procedure to track the specimen during the tilt series. The integration of STEM spectrum imaging for both electron energy-loss and energy-dispersive x-ray microanalysis, is now done using the Revolution system supplied by 4pi company. The President of 4pi, Scott Davilla, is a former Resource staff member, having worked on our HVEM. We are a beta-test site for integration of EELS with STEM, and we will use this system with our new JEM-3200FSC during the next funding cycle (see below).

该子项目是利用该技术的众多研究子项目之一 资源由 NIH/NCRR 资助的中心拨款提供。子项目及 研究者 (PI) 可能已从 NIH 的另一个来源获得主要资金， 因此可以在其他 CRISP 条目中表示。列出的机构是 中心，不一定是研究者的机构。 抽象的： IVEM (JEOL JEM-4000FX) 主要用于 TRD1，即冷冻水合样本的电子断层扫描。 IVEM 配备了 LaB6 阴极、5 轴计算机控制测角仪、多个双倾斜和倾斜旋转样品台以及 Gatan 单倾斜和倾斜旋转低温转移台。 2002年，我们完成了配备2048x2048 CCD相机的Gatan GIF2002柱后能量滤波器的安装，并安装了TVIPS FastScan电视速率CCD相机，用于在非常低的电子剂量下跟踪光束敏感样本。 通过外部计算机控制提供自动电子断层扫描。仪器分辨率为0.14 nm（金格）。 STEM 模式点对点分辨率为 1 nm。 提供完整的分析能力，包括 EELS 和 EDX。 过去报告期的活动： 老化的 Emispec ES Vision STEM 成像和 EDX/EELS 光谱系统被 4pi“Revolution”系统取代。 这是必要的，因为 Emispec 已不复存在，并且设备上的服务也不再可用。 我们借此机会将所有 EM 控制软件整合到一台新的单台计算机上。 我们安装了最新版本的 Gatan 和 Tietz 成像软件。 我们重新编写了用于收集层析倾斜系列图像的自动化系统，因为旧版本是在 Emispec 系统上构建的。 新版本是完全独立的。 它与 Gatan 能量滤波器和 CCD 成像有一个更易于使用的界面，通过内部直接命令发送给 Gatan 数字显微图。 所有 EM 控制和成像现在都可以从同一应用程序窗口完成，并且数据收集所需的鼠标数量也已减少。 新软件由 Dean Leith 编写。 有必要这样做，而不是简单地实施串行 EM 或其他更现代的数据收集系统，因为 JEM-4000 的样品台不像更现代的 TEM 那样中心化，需要更复杂的程序来在倾斜系列期间跟踪样本。 用于电子能量损失和能量色散 X 射线微分析的 STEM 光谱成像集成现在使用 4pi 公司提供的 Revolution 系统完成。 4pi 的总裁 Scott Davilla 是一名前 Resource 员工，曾参与我们的 HVEM 工作。 我们是 EELS 与 STEM 集成的 Beta 测试站点，我们将在下一个融资周期中将此系统与我们的新 JEM-3200FSC 一起使用（见下文）。