Cluster Ion Source for ESCA Instrument

ESCA 仪器的簇离子源

• 批准号: 7791458
• 负责人: DAVID G CASTNER
• 金额: $ 11.5万
• 依托单位: UNIVERSITY OF WASHINGTON
• 依托单位国家: 美国
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-01-07 至 2011-01-06
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7791458
• 关键词: 3-Dimensional; Antibodies; Biocompatible Materials; Biological; Biological Process; Biosensor; Carbohydrates; Cells; Chemicals; Communities; Devices; Electrons; Funding; Image; Ions; Knowledge; Manufacturer Name; Microbial Biofilms; Molecular; Molecular Structure; Pharmaceutical Preparations; Research Project Grants; Resolution; Sampling; Source; Spectrometry, Mass, Secondary Ion; Spectrum Analysis; Stents; Surface; Surface Properties; Techniques; Three-Dimensional Image; Three-Dimensional Imaging; Time; Tissue Engineering; Tissues; Universities; Washington; design; experience; falls; implantable device; improved; instrument; ion source; medical implant; scaffold; success

DESCRIPTION (provided by applicant): Many important cell and tissue functions depend on the surface presentation of molecules, so it is critical to determine the chemical state (composition, molecular structure, and orientation) as well as the distribution of biological moieties present on a surface and in the near surface region of biomedical devices. Thus, it is essential to develop surface analysis techniques capable of providing quantitative and detailed surface chemical state information at high spatial resolutions, both for 2-D imaging of surfaces and 3-D imaging of the near surface region. Until recently it was not possible with electron spectroscopy for chemical analysis (ESCA, also known as x-ray photoelectron spectroscopy or XPS) to obtain 3-D images of biological materials by sputter depth profiling. This is because the commercial ion sources available on ESCA instruments produced monoatomic species such as Ar+ that resulted in significant sample degradation and loss of molecular information during sputtering. A few years ago commercial cluster ion sources such C60+ became available on time-of-flight secondary ion mass spectrometry (ToF-SIMS) instruments. These sources were capable of molecular depth profiling of biological materials and opened the possibility of 3-D imaging with ToF-SIMS. Building on the success these cluster ion beam sources have experienced in the ToF-SIMS community, they are now being developed for commercial ESCA instruments. In the Fall of 2008 the manufacturer of our imaging ESCA instrument at the University of Washington (Kratos Analytical) introduced a cluster ion beam source for their AxisUltra DLD instrument, which now makes ESCA molecular depth profiling and 3-D imaging of biological materials possible. To capitalize on these new capabilities and the benefits they will provide to NIH-funded research projects, we are requesting $115,000 to upgrade our existing Kratos Analytical AxisUltra DLD ESCA instrument with the new cluster ion beam source. ESCA and ToF-SIMS are complementary surface analysis techniques. ESCA provides quantitative information about elemental and chemical species composition, while ToF-SIMS provides more detailed molecular structure information. Thus, combined 3-D imaging with both ESCA and ToF-SIMS provide detailed quantitative and molecular structure information about a sample. Research projects that will benefit from the new 3-D ESCA imaging capability include analysis of medical implants (e.g., drug-loaded/coated stents), biofilms, cell sheets, tissue sections, tissue engineering scaffolds, microarray devices (DNA, antibody, carbohydrate, etc.), biosensors, etc. HEALTH RELEVANCE: Knowledge about biomedical implant surfaces and an understanding of how these surfaces interact and direct biological processes when such a device is placed in the body is needed to permit the rational design of new and improved biomedical implants. The proposed cluster ion beam source will provide new information about the surface properties of biomedical devices that is needed to achieve this objective.

描述（由申请人提供）：许多重要的细胞和组织功能取决于分子的表面呈现，因此确定化学状态（组成、分子结构和方向）以及生物部分的分布至关重要生物医学设备的表面和近表面区域。因此，有必要开发能够以高空间分辨率提供定量和详细的表面化学状态信息的表面分析技术，无论是表面的 2D 成像还是近表面区域的 3D 成像。直到最近，还无法使用用于化学分析的电子能谱（ESCA，也称为 X 射线光电子能谱或 XPS）通过溅射深度剖析获得生物材料的 3D 图像。这是因为 ESCA 仪器上可用的商业离子源产生单原子物质，例如 Ar+，导致溅射过程中样品显着降解和分子信息丢失。几年前，C60+ 等商业簇离子源可用于飞行时间二次离子质谱 (ToF-SIMS) 仪器。这些来源能够对生物材料进行分子深度分析，并开启了利用 ToF-SIMS 进行 3D 成像的可能性。基于这些簇离子束源在 ToF-SIMS 领域取得的成功，它们现在正在为商用 ESCA 仪器开发。 2008 年秋季，华盛顿大学 ESCA 成像仪器制造商 (Kratos Analytical) 为其 AxisUltra DLD 仪器引入了簇离子束源，现在使 ESCA 分子深度分析和生物材料 3-D 成像成为可能。为了利用这些新功能以及它们将为 NIH 资助的研究项目带来的好处，我们请求 115,000 美元来升级我们现有的 Kratos Analytical AxisUltra DLD ESCA 仪器，配备新的簇离子束源。 ESCA 和 ToF-SIMS 是互补的表面分析技术。 ESCA 提供有关元素和化学物质组成的定量信息，而 ToF-SIMS 提供更详细的分子结构信息。因此，结合 ESCA 和 ToF-SIMS 的 3D 成像可提供有关样品的详细定量和分子结构信息。受益于新的 3-D ESCA 成像功能的研究项目包括医疗植入物（例如载药/涂层支架）、生物膜、细胞片、组织切片、组织工程支架、微阵列设备（DNA、抗体、碳水化合物）的分析等）、生物传感器等 健康相关性：需要了解生物医学植入物表面的知识，并了解当此类设备放置在体内时这些表面如何相互作用并指导生物过程，以便合理设计新的和改进的生物医学植入物。所提出的簇离子束源将提供实现这一目标所需的有关生物医学设备表面特性的新信息。