TOF-SIMS INSTRUMENT

TOF-SIMS仪器

• 批准号: 7335089
• 负责人: DAVID G CASTNER
• 金额: $ 49.98万
• 依托单位: UNIVERSITY OF WASHINGTON
• 依托单位国家: 美国
• 财政年份: 2006
• 资助国家: 美国
• 起止时间: 2006-03-15 至 2007-03-14
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/7335089
• 关键词: DNA; bioengineering /biomedical engineering; biomaterial development /preparation; biomaterials; cell sorting; computers; implant; ions; library; mass spectrometry; microscopy; orientation; performance; tissue /cell culture; tissues; university

This subproject is one of many research subprojects utilizing the resources provided by a Shared Instrumentation Grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the grant, which is not necessarily the institution for the investigator. DESCRIPTION (provided by applicant): For biomedical systems, determining the chemical state (composition, molecular structure, and orientation) and distribution of biological moieties present on a surface is critical. Many important cells and tissue functions depend on the arrangement of molecules at their surfaces. Also, a central goal of modern bioengineering is the development of biomaterial surfaces that direct the biological healing response. These complex, novel surfaces are envisioned to have a well-defined array of recognition sites designed to interact specifically with cells. Thus, it is essential to develop surface analysis techniques capable of providing detailed surface chemical state information at high spatial resolutions. The IONTOF time-of-flight secondary ion mass spectrometry (ToF-SIMS) system requested in this application will provide essential, new capabilities for these studies. In the past 10 years instrumentation manufacturers have made significant advances in all areas of ToF-SIMS instrument performance that will benefit NIH-funded biomedical research. The specific improvements over our current ToF-SIMS systems that will be provided by the new IONTOF TOF.SIMS5 system with Bi and Ceo cluster ion beam sources are: 1) >10x increase in secondary ion yield for most samples; 2) >30% improvement in mass resolution; 3) molecular depth profiling for some organic and biological samples (not currently possible with the existing instruments); 4) increased sensitivity providing lower detection limits and shorter data acquisition times; 5) more efficient and easier to use charge neutralization system; 6) computer controlled sample stage; 7) latest software (data acquisition, data analysis, and spectral library with search engine) and 8) decreased instrument downtime. In the imaging mode ToF-SIMS provides detailed information about the molecular surface structure at a spatial resolutions of < 2 microns (high mass resolution mode) and <200 nm (low mass resolution mode). This information is essential for determining the structure-function relationship of a biomaterial surface to its biological activity. Relevant applications for ToF-SIMS analysis include biocompatibility of implants, biomolecule separations, cell culture, biosensors, bacterial-induced corrosion, ELISA assays, and DNA manipulations. Combining the new capabilities of the proposed ToF-SIMS system with the existing the University of Washington imaging electron spectroscopy for chemical analysis (ESCA) and scanning probe microscopy (SPM) systems will provide a powerful set of complementary biomedical surface analysis techniques that will make a significant contribution to NIH- funded biomedical research projects. Knowledge of the nature of biomedical implant surfaces and an understanding of how these surfaces direct biological processes is needed to permit the rational design of biomedical implants. The proposed ToF-SIMS instrument will help achieve this goal.

该副本是利用NIH/NCRR资助的共享仪器赠款提供的资源的许多研究子项目之一。子弹和调查员（PI）可能已经从其他NIH来源获得了主要资金，因此可以在其他清晰的条目中代表。列出的机构是赠款，这不一定是调查人员的机构。描述（由申请人提供）：对于生物医学系统，确定化学状态（组成，分子结构和方向）以及存在于表面上的生物学部分的分布至关重要。许多重要的细胞和组织功能取决于分子在其表面上的排列。同样，现代生物工程的一个核心目标是指导生物愈合反应的生物材料表面的发展。设想这些复杂的新型表面具有明确定义的识别位点，该识别位点旨在专门与细胞相互作用。因此，必须开发能够在高空间分辨率下提供详细的表面化学状态信息的表面分析技术。本应用程序中要求的离子飞行时间二级离子质谱（TOF-SIMS）系统将为这些研究提供必不可少的新功能。在过去的10年中，仪器制造商在TOF-SIMS仪器性能的所有领域都取得了重大进步，这将使NIH资助的生物医学研究受益。与新的iOntof tof.sims5系统相比，具有BI和CEO群集离子束源将提供的当前TOF-SIMS系统的特定改进为：1）>大多数样品的次级离子产量增加10倍； 2）> 30％的质量分辨率提高； 3）一些有机和生物样品的分子深度分析（现有仪器目前无法使用）； 4）提高灵敏度，提供较低的检测限制和较短的数据采集时间； 5）更有效，更易于使用电荷中和系统； 6）计算机控制的样本阶段； 7）最新软件（带有搜索引擎的数据采集，数据分析和光谱库）和8）减少了仪器停机时间。在成像模式下，TOF-SIMS在空间分辨率<2微米（高质量分辨率模式）和<200 nm（低质量分辨率模式）下提供了有关分子表面结构的详细信息。该信息对于确定生物材料表面与其生物活性的结构功能关系至关重要。 TOF-SIMS分析的相关应用包括植入物的生物相容性，生物分子分离，细胞培养，生物传感器，细菌诱导的腐蚀，ELISA分析和DNA操纵。将拟议的TOF-SIMS系统的新功能与现有的华盛顿大学成像电子光谱进行化学分析（ESCA）和扫描探针显微镜（SPM）系统相结合，将为NIH资助的生物医学研究项目做出重要贡献。了解生物医学植入物表面的性质以及对这些表面如何直接生物过程的理解以允许生物医学植入物的理性设计。拟议的TOF-SIMS仪器将有助于实现这一目标。