Mesoscopic electric field predictions and specimen shape measurements to improve reconstruction in atom probe tomography

介观电场预测和样品形状测量可改善原子探针断层扫描的重建

• 批准号: 2825214
• 金额: --
• 依托单位: Imperial College London
• 依托单位国家: 英国
• 项目类别: Studentship
• 财政年份: 2022
• 资助国家: 英国
• 起止时间: 2022 至 无数据
• 项目状态: 未结题
• 来源: https://gtr.ukri.org/projects?ref=studentship-2825214
• 关键词: Mesoscopic; electric; field; predictions; specimen

Atom probe tomography is a microscopy and microanalysis technique that can map the distribution of each element in small volume of a material with near-atomic precision. A new facility at Imperial College London is being set up to allow for facile transfer, under controlled atmosphere, of specimens from the atom probe into a transmission electron microscope, allowing for precise imaging of atom probe specimens, which sharp needles below 100 nanometres across. In the analysis of complex devices, typically multilayer stacks, the specimen can develop complex shapes that affect the spatial precision of the data reconstruction. This project will build on a collaboration with the University of Oxford to perform both interrupted atom probe experiments to acquire specimen shapes by electron microscopy and feed these into a mesoscopic model to improve reconstruction protocols, and correlate structure-composition and activity on materials for energy application. We will combine these models with experimental measurements of specimen shape on thin films of materials for energy applications, imaged by transmission-electron microscopy at different stages of the analysis. The developed model is not linked or embedded with the instrument provided by CAMECA, so it will not provide a competitive advance to CAMECA as this is mostly for academic use.

原子探针断层扫描是一种显微镜和微分析技术，它可以以少量精度绘制每个元素的分布。正在建立伦敦帝国学院的新设施，以允许在受控大气下轻松地转移原子探针到变速器电子显微镜的标本，从而精确地对原子探针样品进行精确成像，这些标本将其尖锐的针头尖锐的针头刺激在100纳米以下。在对复杂设备的分析中，通常是多层堆栈，样品可以产生影响数据重建空间精度的复杂形状。该项目将与牛津大学合作进行，以进行中断的原子探针实验，以通过电子显微镜获取样品形状，并将其馈入介质模型，以改善重建方案，并将其在能量应用材料上的结构组成和活动相关联。我们将将这些模型与在分析不同阶段的传输电子显微镜成像的材料薄膜上对试样形状进行实验测量。开发的模型与Cameca提供的仪器没有连接或嵌入，因此它不会为Cameca提供竞争进步，因为这主要用于学术用途。