SURFACE SCANNING USING NEAR-FIELD MICROWAVE MICROSCOPY

使用近场微波显微镜进行表面扫描

• 批准号: 2331093
• 金额: --
• 依托单位: CARDIFF UNIVERSITY
• 依托单位国家: 英国
• 项目类别: Studentship
• 财政年份: 2020
• 资助国家: 英国
• 起止时间: 2020 至 无数据
• 项目状态: 已结题
• 来源: https://gtr.ukri.org/projects?ref=studentship-2331093
• 关键词: SURFACE; SCANNING; USING; NEAR; FIELD

This project combines the world class expertise of Renishaw in manufacturing and metrology with Cardiff's Centre for High Frequency Engineering, using near field microwave microscopy for post machine verification of metal structures. We will focus on structures that would be otherwise difficult to assess using traditional methods such as coordinate measurement machines (CMM). Using the electric field interaction with the sample at the microwave probe tip, we will be able to assess (with exquisite accuracy) small capacitance changes associated with tip-to-surface distance and hence surface morphology. It is expected that the microwave probe could be incorporated into Renishaw's commercial CMMs, to offer unparalleled versatility.

该项目将雷尼绍在制造和计量方面的世界级专业知识与卡迪夫高频工程中心相结合，使用近场微波显微镜对金属结构进行机器后验证。我们将重点关注使用坐标测量机 (CMM) 等传统方法难以评估的结构。利用微波探针尖端处与样品的电场相互作用，我们将能够（以极高的精度）评估与尖端到表面距离以及表面形态相关的微小电容变化。预计微波探头可以集成到雷尼绍的商用坐标测量机中，以提供无与伦比的多功能性。