High Resolution Ion Beam Analysis Facility

高分辨率离子束分析设备

• 批准号: EP/T01931X/1
• 负责人: Roger Webb
• 金额: $ 200.11万
• 依托单位: University of Surrey
• 依托单位国家: 英国
• 项目类别: Research Grant
• 财政年份: 2020
• 资助国家: 英国
• 起止时间: 2020 至 无数据
• 项目状态: 已结题
• 来源: https://gtr.ukri.org/projects?ref=EP%2FT01931X%2F1
• 关键词: Resolution; Ion; Beam; Analysis; Facility

The Surrey Ion Beam Centre has a long history (~40 years) of employing MeV Ion Beam Analysis techniques to aid UK academia and industry in understanding and developing materials in a number of diverse areas from cultural heritage and biomedical applications to electronic and photonic materials and steels and ceramics. In the past few years new detectors have become available which substantially increase the resolution of these classic techniques (Rutherford Back Scattering, Particle Induced X-ray Emission and Elastic Recoil Detection) which not only increase the selectivity, sensitivity and specificity of the techniques but also have the potential to add new features that will allow the small chemical shifts in the X-ray signals which can identify the bonding states of elements at depths of a few microns below a surface and in full ambient conditions. The ion beams used are such low intensity that for all but the most sensitive of materials will remain unaffected by the probing beam.The new facilities requested will greatly enhance the current UK capability.

萨里离子光束中心具有悠久的历史（约40年），它采用MEV离子束分析技术来帮助英国学术界和工业，从而在许多不同领域的了解和开发材料，从文化遗产和生物医学应用到电子和光子材料以及钢铁和钢铁和陶瓷。在过去的几年中，新探测器已成为可用的，从而大大增加了这些经典技术的分辨率（Rutherford背部散射，粒子诱导的X射线发射和弹性后退检测），不仅会增加技术的选择性，敏感性和特异性环境条件。所使用的离子光束如此低强度，除了最敏感的材料以外，所有材料都不会受到探测光束的影响。所需的新设施将极大地增强当前的英国能力。

项目成果

Diffusiophoresis-Driven Stratification in Pressure-Sensitive Adhesive Films from Bimodal Waterborne Colloids.

• DOI: 10.1021/acsapm.2c02044
• 发表时间: 2023-02-10
• 期刊: ACS APPLIED POLYMER MATERIALS
• 影响因子: 5
• 作者: Palmer, Toby R.;van der Kooij, Hanne M.;Bakar, Rohani Abu;McAleese, Callum D.;Duewel, Mathis;Greiner, Katja;Couture, Pierre;Sharpe, Matthew K.;Keddie, Joseph L.
• 通讯作者: Keddie, Joseph L.