New Developments in Quantitative 3D Chemical Imaging

定量 3D 化学成像的新进展

基本信息

批准号：
EP/S019863/1
负责人：
Nicholas Lockyer
金额：
$ 107.65万
依托单位：
University of Manchester
依托单位国家：
英国
项目类别：
Research Grant
财政年份：
2019
资助国家：
英国
起止时间：
2019 至无数据
项目状态：
已结题

来源：
https://gtr.ukri.org/projects?ref=EP%2FS019863%2F1
关键词：
New Developments Quantitative 3D Chemical

项目摘要

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an outstanding method of chemical analysis, used extensively in academia and industry to characterise complex samples in 2D/3D. Application areas include materials science, biology, healthcare, energy etc. In the analysis the high-energy 'primary' ion projectile impact on a sample surface, causes ejection of 'secondary' molecular ions which are analysed by a mass spectrometer to provide chemically-rich material characterisation. Scanning the primary beam across the sample provides 2D surface imaging (>100 nm lateral resolution) and by sequentially collecting images while the sample is eroded, 3D sub-surface imaging (>3 nm depth resolution). This unique combination of analytical capabilities means ToF-SIMS is unmatched in its potential to determine, in a single analysis, the composition and detailed distribution of multiple, chemicals in complex samples. Importantly, this technology supports 'discovery mode' research, where the analysis is not biased towards pre-selected, labelled compounds, and therefore leads to hypothesis generation. The analysis is highly-multiplexed and comprehensive - hundreds of species can be potentially detected in a single measurement, limited only by the sensitivity of the process, which here we seek to enhance 100-fold.This proposal addresses critical challenges from next-generation samples demanding greater sensitivity, broader chemical coverage and reliable quantification to address issues including sub-cellular drug localisation and nanoscale molecular materials. It builds on our internationally-leading reputation for innovative ToF-SIMS instrumentation. The characteristics of the primary ion are fundamental in determining impact dynamics at the sample surface and the success of the resulting measurement. The challenge of producing intact secondary molecules from the sample has been largely solved using polyatomic cluster projectiles e.g. C60 and Ar2000 which produce ~100 sputtered molecules per impact. However, only ~0.001-0.1% of these molecules are produced as charged ions, which is necessary for their detection. Clearly there is huge room for improvement in the ionisation efficiency. The principle of projectile-initiated chemical reactions promoting ionisation of sputtered species has recently been firmly established by our work and that of others. We must now build on this knowledge and develop complementary approaches to meet the ionisation challenge and deliver quantitative compositional information.We have assembled a multidisciplinary team of international experts from academia and industry, which is uniquely positioned to pursue this important project. Building on >20 years' experience in innovation of SIMS instrumentation, enabled through EPSRC support and close collaboration with UK Industry, we will develop next-generation reactive ion beams and analytical methodology. This will deliver further transformative gains in performance which are critical to meet future application needs. Our novel results will be framed within the context of emerging theory to understand mechanisms of enhanced ionisation and to underpin the optimisation of projectile parameters. They will stimulate further development of theoretical models of the physical processes underlying SIMS and related techniques.The project is highly-adventurous, providing beyond state-of-the-art analytical capability underpinned with new fundamental understanding. We are ideally placed to exploit this through the interdisciplinary research collaborations at the Manchester Institute of Biotechnology and the Sir Henry Royce Institute for Advanced Materials. The vastly increased quality of data will result in new understanding in a wide range of applications spanning many areas of science and technology.

飞行时间的二级离子质谱法（TOF-SIMS）是一种出色的化学分析方法，在学术界和工业中广泛使用，以表征2D/3D中的复杂样品。应用领域包括材料科学，生物学，医疗保健，能量等。在分析中，高能“原发性”离子弹丸对样品表面的影响会导致“次级”分子离子的射精，这些分子离子通过质谱仪进行了分析，以提供化学富含化学的材料表征。在样品上扫描主梁可提供2D表面成像（> 100 nm的横向分辨率），并在侵蚀样品时依次收集图像，3D地下表面成像（> 3 nm深度分辨率）。分析能力的这种独特组合意味着TOF-SIMS在单个分析中的潜力无与伦比，在复杂样品中的多种化学物质的组成和详细分布。重要的是，该技术支持“发现模式”的研究，其中分析没有偏向于预选的，标记的化合物，因此导致假设产生。 The analysis is highly-multiplexed and comprehensive - hundreds of species can be potentially detected in a single measurement, limited only by the sensitivity of the process, which here we seek to enhance 100-fold.This proposal addresses critical challenges from next-generation samples demanding greater sensitivity, broader chemical coverage and reliable quantification to address issues including sub-cellular drug localisation and nanoscale molecular materials.它基于我们在创新的TOF-SIMS仪器中享有国际领先的声誉。主要离子的特征对于确定样品表面的影响动态和结果测量的成功至关重要。从样品中产生完整的二级分子的挑战已在很大程度上使用多原子簇弹丸来解决，例如C60和AR2000每撞击产生约100个溅射分子。但是，这些分子中只有〜0.001-0.1％作为带电离子产生，这是它们检测所必需的。显然，电离效率有巨大的改善空间。最近，我们的工作和他人的工作牢固确立了促进溅射物种电离的化学反应原理。现在，我们必须以这些知识为基础，并开发互补的方法来应对电离挑战并提供定量构图信息。我们组建了一个来自学术界和行业的国际专家团队的多学科团队，这是从事这一重要项目的独特位置。在> 20年以来的SIMS仪器创新经验的基础上，通过EPSRC支持并与英国行业进行了密切合作，我们将开发下一代反应性离子光束和分析方法。这将带来进一步的变革性能，这对于满足未来的应用需求至关重要。我们的新成果将在新兴理论的背景下构建，以了解增强电离的机制并支持弹丸参数的优化。他们将刺激SIMS和相关技术基础的物理过程的理论模型的进一步发展。该项目是高度趋势的，提供了超出最新的基本理解所基于的最新分析能力。理想情况下，我们可以通过曼彻斯特生物技术学院和亨利·罗伊斯爵士高级材料研究所的跨学科研究合作来利用这一点。数据质量的大量提高将导致在许多科学和技术领域的广泛应用中，都有新的了解。