CERAMIC SCINTILLATORS FOR X-RAY COMPUTED TOMOGRAPHY

用于 X 射线计算机断层扫描的陶瓷闪烁体

• 批准号: 2108221
• 负责人: RENGARAJAN SUDHARSANAN
• 金额: $ 7.49万
• 依托单位: SPIRE CORPORATION
• 依托单位国家: 美国
• 财政年份: 1994
• 资助国家: 美国
• 起止时间: 1994-07-01 至 1995-02-28
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/2108221
• 关键词: X ray; biomedical equipment development; cadmium; ceramics; computed axial tomography; molecular film; radiation detector; sulfur; tellurium; tin

Spire will develop a new X-ray detector by monolithically integrating photodiodes on ceramic scintillators for X-ray computed tomography (XCT). The proposed detector will have a CdTe/CdS photodiode fabricated directly on the scintillator instead of the mechanically stacked Si photodiodes in current use. Reduced optical loss at the photodiode/scintillator interface and a better spectral match to the scintillator emission wavelength will improve performance over conventional detectors. The new detector will reduce assembly complexity by obviating the need for precise stacking of photodiodes on the scintillator. In Phase I, we will demonstrate a single-element integrated X-ray detector with improved signal. CdTe/CdS photodiode structures will be deposited directly on the scintillator by a low-cost thermal evaporation technique. The detector will be tested using a diagnostic X-ray source. During Phase II, we will design and fabricate a detector array and determine the potential of these integrated X-ray detectors for X-ray computed tomography. Spire will work closely with XCT manufacturers and end users toward commercialization of this technology.

Spire将通过单体整合开发新的X射线检测器 用于X射线计算机断层扫描（XCT）的陶瓷闪烁体上的光电二极管。 所提出的检测器将直接制造CDTE/CDS光电二极管 在闪烁体上，而不是机械堆叠的Si光电二极管 当前使用。光电二极管/闪光灯接口处的光损失减少 与闪烁体发射波长更好的光谱匹配将 改善传统探测器的性能。新探测器将 通过消除需要精确堆叠的需要来降低组装复杂性 闪烁体上的光电二极管。 在第一阶段，我们将演示一个单元素集成的X射线检测器 信号改善。 CDTE/CDS光电二极管结构将沉积 通过低成本的热蒸发技术直接在闪烁体上。 检测器将使用诊断X射线源测试。在阶段 ii，我们将设计和制造一个检测器阵列，并确定 这些集成的X射线检测器的潜力计算 断层扫描。 Spire将与XCT制造商和最终用户紧密合作 致力于这项技术的商业化。