Power Adjustment Testing for Next-Generation Low-Power LSI Circuits

下一代低功耗LSI电路的功率调整测试

• 批准号: 22300017
• 负责人: WEN Xiaoqing
• 金额: $ 4.16万
• 依托单位: Kyushu Institute of Technology
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2010
• 资助国家: 日本
• 起止时间: 2010 至 2012
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-22300017/
• 关键词: LSIテスト; 低電力テスト; テスト電力調整; 遅延テスト; 微小遅延故障; 活性化パス; 高品質化; 高信頼化

There are two major problems in LSI testing, namely decreasing test yield due to excessive delay along sensitized paths and decreasing test quality due to inadequate delay along sensitized paths. In this research, a novel scheme has been established, which dynamically adjusts regional power dissipation in the neighborhood of sensitized paths to minimize its impact on test yield and test quality. This scheme of power adjustment testing is expected to contribute to higher test yield and better test quality.

LSI测试中有两个主要问题，即由于沿敏化路径延迟过度延迟而导致的测试产量降低，并且由于沿敏化路径的延迟不足而降低了测试质量。在这项研究中，已经建立了一种新的方案，该方案在敏感道路附近动态调整了区域功率耗散，以最大程度地减少其对测试产量和测试质量的影响。这种功率调节测试方案有望导致更高的测试收率和更好的测试质量。

项目成果

Test Power Reduction : From Artillery Fire to Sniper Fire

测试功率降低：从炮火到狙击手火力

• 发表时间: 2010
• 作者: T.Kimura;N.Kai;M.Amagasaki;M.Iida;M.Kuga;T.Sueyoshi;X.Wen
• 通讯作者: X.Wen

Power-Aware Testing: The Next Stage

功耗感知测试：下一阶段

• 发表时间: 2013
• 作者: N.A. Zakaria;M.Z Khalid;X. Wen;X. Wen
• 通讯作者: X. Wen

Low-Aware Test for Low-Power Devices

低功耗设备的低感知测试

• 发表时间: 2010
• 作者: S.Maruyama;et al;X.Wen
• 通讯作者: X.Wen

A novel scan segmentation design method for avoiding shift timing failure in scan testing

• DOI: 10.1109/test.2011.6139162
• 发表时间: 2011-09
• 期刊: 2011 IEEE International Test Conference
• 作者: Yuta Yamato;X. Wen;M. Kochte;K. Miyase;S. Kajihara;Laung-Terng Wang

A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing

• DOI: 10.1587/transinf.e94.d.833
• 发表时间: 2011-04
• 期刊: IEICE Trans. Inf. Syst.
• 作者: Yuta Yamato;X. Wen;K. Miyase;H. Furukawa;S. Kajihara