Study of the Microstructure of iViaterials by Synchrotron Radiation Wavelength-Modulated Diffraction Method

同步辐射波长调制衍射法研究iVaterials的微观结构

• 批准号: 14550659
• 负责人: IWASAKI Hiroshi
• 金额: $ 2.05万
• 依托单位: Ritsumeikan University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2003
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-14550659/
• 关键词: Synchrotron Radiation; X-ray Diffraction; Crystal Structure Analysis; Anomalous Scattering; Multilayer Monochromator; X線回析

We established utilizing the continuous nature of spectrum and the high brightness of synchrotron radiation a new diffraction method "wavelength-modulated diffraction" and showed that it is possible to derive information on the microstructure of materials that is not obtainable by other methods. From the intensity profile of Bragg reflections recorded using radiation of a band of wavelength in the vicinity of the absorption edge of an atom in organic crystal, phases of the structure factors were derived.In the present research, the method has been extended so that parallel radiation beam of a band of wavelength isproduced by reflection by a depth'graded multilayer at the X-ray diffraction beamline at the Ritsumeikan Synchrotron Radiation Center and used to record intensity profiles of Bragg reflections. With a single crystal of a ferrocene derivative known to have an enantiomorphous structure as a sample and the wavelength band set so as to include the absorption edge of the iron atom, clear contrast has been observed at the edge between the Friedel pairs of reflections and the chirality of the structure has been unequivocally determined. It has also been shown that the method has a wide range of application in diffraction crystallography.

我们利用频谱的连续性质和同步辐射的高亮度建立了一种新的衍射方法“波长调节衍射”，并表明可以得出有关材料微观结构的信息，而其他方法无法获得其他方法。根据使用有机晶体中原子吸收边缘的波长辐射记录的bragg反射的强度曲线，得出了结构因子的阶段。在当前的研究中，该方法已扩展，因此该方法已被扩展为相似波长条带的辐射光束通过在Ritsumeikan同步辐射中心的X射线衍射光束线上在X射线衍射光束线上的反射来产生，并用于记录Bragg反射的强度曲线。二茂铁衍生物的单个晶体已知具有对映​​的结构作为样品和波长套件，以包括铁原子的吸收边缘，在弗里德尔对反射和反射和弗里德尔对之间的边缘已经观察到了明显的对比度。该结构的手性已得到明确确定。还显示该方法在衍射晶体学中具有广泛的应用。

项目成果

T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura, T.Shoji: "A Wide-B andp ass Monochromator and Jts Application to the Determination of Absolute Structure"J.Appl.Cryst.. 37. 136-142 (2004)

T.Koganezawa、H.Iwasaki、N.Nakamura、Y.Yoshimura、T.Shoji：“宽频带单色仪及其在绝对结构测定中的应用”J.Appl.Cryst.. 37. 136-142

T.Koganezawa: "Phase Determination by Wavelength-Modulated Diffraction. II."Acta Cryst.. A58(Suppl). C84 (2002)

T.Koganezawa：“通过波长调制衍射进行相位测定。II”Acta Cryst.. A58（增刊）。

T.Koganezawa: "A Diffraction System with an X-ray Beam of a Band of Wavelength"Proc.Intern.Conf.Synchrotron Radiation Instrumentation. (印刷中). (2004)

T. Koganezawa：“具有一定波长带的 X 射线束的衍射系统”Proc.Intern.Conf.Synchrotron Radiation Instrumentation（正在出版）。

T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura, T.Shoji: "A Diffraction System with an X-ray Beam of a Band of Wavelength"Proc. 8th Intern. Conf. Synchrotron Radiation Instrurnentatior. (in press). (2004)

T.Koganezawa、H.Iwasaki、N.Nakamura、Y.Yoshimura、T.Shoji：“具有波长带 X 射线束的衍射系统”Proc。

T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura: "Synchrotron Radiation Wavelength-Modulated Diffraction Method and Its Recent Developments"Rigaku Denki Journal. 34. 4-14 (2003)

T.Koganezawa、H.Iwasaki、N.Nakamura、Y.Yoshimura：“同步辐射波长调制衍射方法及其最新进展”Rigaku Denki Journal。