Mechanical deformation of layered semiconductor structures

层状半导体结构的机械变形

• 批准号: DP0344167
• 负责人: Prof Jodie Bradby
• 金额: $ 17.48万
• 依托单位: The Australian National University
• 依托单位国家: 澳大利亚
• 项目类别: Discovery Projects
• 财政年份: 2003
• 资助国家: 澳大利亚
• 起止时间: 2003-04-14 至 2006-10-19
• 项目状态: 已结题
• 来源: https://dataportal.arc.gov.au/RGS/Web/Grants/DP0344167
• 关键词: Mechanical; deformation; layered; semiconductor; structures

This project aims to reveal the mechanisms of mechanical deformation in thin film layered semiconductors structures. Currently, there is little knowledge in this area despite the importance of such structures in electronic and optoelectronic devices. Layered structures are not expected to respond to mechanical stress in the same way as bulk materials, as a result of size constraints in nanoscale films, the critical importance of strain, and the possibility of disparities between the mechanical properties of the individual layers. The results of this project will dramatically enhance the understanding of the deformation responses of nanoscale structures to mechanical stress.

该项目旨在揭示薄膜分层半导体结构中机械变形的机制。 当前，尽管这种结构在电子和光电设备中的重要性很重要，但在这一领域几乎没有知识。 由于纳米级膜中的尺寸约束，应变的至关重要性以及各个层的机械性能之间的差异可能性，因此预计不会以与散装材料相同的方式对机械应力做出反应。 该项目的结果将大大增强对纳米级结构对机械应力的变形响应的理解。