Analysis of Atomic Surface Structure Using In-Situ AFM

使用原位 AFM 分析原子表面结构

基本信息

批准号：
02555166
负责人：
ITAYA Kingo
金额：
$ 10.11万
依托单位：
Tohoku Univ.
依托单位国家：
日本
项目类别：
Grant-in-Aid for Developmental Scientific Research (B)
财政年份：
1990
资助国家：
日本
起止时间：
1990 至 1991
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-02555166/
关键词：
AFM STM Solid liquid interface Electrode surface

项目摘要

In-situ characterization of solid(electrode)/solution interfaces is of particularly importance in electrochemical processes occurring at these interfaces. Recently, our group and several other groups have achieved atomic images of some metals or semiconductors at the electrode/solution interface using in situ scanning tunneling microscopy (STM). However, STM measurements has been limited to only electrically conductive materials in which the STM measures tunneling currents between the tip and the sample. On the contrary, the atomic force microscopy (AFM), which is one of the scanning probe microscopes, has been possible to measure the surface structure of nonconductive materials. In this study, we aimed at the development of in situ AFM methods at solid/solution interfaces.Following results were obtained in our studies so far.1)Vibration isolation systems, feed back circuits, and other components have been established using an STM apparatus in order to achieve an atomic resolution.2)Observations of atomic images of gold (Au) and adsorbed species have been achieved in STM measurements.3)AFM observations of atomic image of mica and graphite have been achieved in a pure water.4)AFM observations of step-terrace structures on Au(111) have been achieved under the potential controlled.5)Developments of a commercial available apparatus of AFM made by Seiko Instruments Inc. have been done. This fruit bases on our fundamental results as mentioned above.

固体（电极）/溶液界面的原位表征在这些接口处发生的电化学过程中尤其重要。最近，我们的小组和其他几个组使用原位扫描隧道显微镜（STM）实现了电极/溶液界面处的某些金属或半导体的原子图像。但是，STM测量仅限于仅导电材料，其中STM测量尖端和样品之间的隧穿电流。相反，是扫描探针显微镜之一的原子力显微镜（AFM）可以测量非导电材料的表面结构。在这项研究中，我们旨在在固体/溶液界面上开发原位AFM方法。到目前为止，在我们的研究中获得了跟踪结果。1）振动隔离系统，返回回路和其他组件已使用STM Appartus建立为了实现原子分辨率。2）在STM测量中已经实现了金（AU）和吸附物种原子图像的观察。3）在纯水中已经实现了云母和石墨原子图像的AFM观察。4）在潜在控制下，已经实现了对AU（111）的AFM观察。5）Seiko Instruments Inc.制造的AFM的商业可用设备的开发已完成。如上所述，这种果实基于我们的基本结果。