Development of Hamos-type X-ray micro-analyzer using a cylindrically, bent graphite monochromator

使用圆柱形弯曲石墨单色仪开发Hamos型X射线显微分析仪

基本信息

批准号：
12555170
负责人：
MATSUBARA Eiichiro
金额：
$ 7.68万
依托单位：
Tohoku University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
2000
资助国家：
日本
起止时间：
2000 至 2002
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-12555170/
关键词：
Bent graphite monochoromator X-ray micronanalyzer Mapping of X-ray fluorescence X-ray diffraction Maximum entropy method image data processing グラファイト集光素子蛍光X線マキシマムエンドロピー法

项目摘要

Fluorescent radiations emitted from a certain point in a sample are focused by diffracting on the inner surface of a cylindrically bent single crystal. Using this fundamental principle, an X-ray microanalyzer has been developed. Three important study results contribute to the present development.(1) First of all, a new fabrication technique of a cylindrical bend graphite single crystal with a large curvature is essential in order to effectively collect fluorescent radiation from a sample. In the present study, the cylindrical graphite with a curvature radius of 2l.07mm was produced by the new fabrication process developed by Matsushita Electric Industrial Co. Ltd.(2) Secondarily, an XMA apparatus consisting of a sealed X-ray tube, sample holder, the bend graphite monochromator and an imaging p]ate as a two dimensional detector was designed so that the best suited performance is expected.(3) Thirdly, a computer program for image data processing based upon the maximum entropy principle was developed to improve a special resolution of the observed image.From the above results, the present XMA apparatus has been developed. In the present circumstances, the best spatial resolution that has been achieved in the present XMA is about 0.1 mm. This is about 10 times larger than the common XMA apparatus using electron convergent beams (EPMA) and about one tenth of the ordinary X-ray fluorescent analyzer. In addition, it takes a quite long time for the image data processing by the present program. We must improve its algorism for better performance. In spite of the worse spatial resolution, the pres t system can be applied to some materials which are not measured by EPMA, such as wet materials, melts, some biomaterials. Consequently, we will develop the present XMA as the complimentary method of EPMA as well as improve it for a better performance.

从样品中的特定点发出的荧光辐射通过衍射在圆柱弯曲的单晶的内表面来聚焦。使用该基本原理，已经开发了X射线微分析仪。三个重要的研究结果有助于当前的发展。（1）首先，具有较大曲率的圆柱形弯曲石墨单晶的新制造技术对于有效从样品中收集荧光辐射至关重要。 In the present study, the cylindrical graphite with a curvature radius of 2l.07mm was produced by the new fabrication process developed by Matsushita Electric Industrial Co. Ltd.(2) Secondarily, an XMA apparatus consisting of a sealed X-ray tube, sample holder, the bend graphite monochromator and an imaging p]ate as a two dimensional detector was designed so that the best suited performance is （3）第三，开发了基于最大熵原理的图像数据处理的计算机程序，以改善观察到的图像的特殊分辨率。从上面的结果中，已经开发了当前的XMA设备。在当前情况下，目前XMA中实现的最佳空间分辨率约为0.1 mm。使用电子收敛梁（EPMA），大约是普通XMA设备的大约10倍，约占普通X射线荧光分析仪的十分之一。此外，通过本程序进行图像数据处理需要很长时间。我们必须改善其算法，以提高性能。尽管空间分辨率较差，但可以将PRES T系统应用于某些未由EPMA测量的材料，例如湿材料，融化，某些生物材料。因此，我们将开发当前的XMA作为EPMA的免费方法，并将其改进以提高性能。