Nature and structure of sub-nanometer defects in metal oxides by complex electron spectro-microscopy

通过复杂电子能谱显微镜研究金属氧化物中亚纳米缺陷的性质和结构

• 批准号: 14350340
• 负责人: MUTO Shunsuke
• 金额: $ 10.69万
• 依托单位: Nagoya University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2004
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-14350340/
• 关键词: transmission electron microscopy; electron energy loss spectroscopy; wavelength-dispersive x-ray analysis; cathodoluminescence; defect clusters; first-principle electronic state calculation; light elements analysis; metal oxides; 透過型電子顕微鏡; 酸素複合欠陥

This project aims to develop a complex electron spectroscope TEM for exploring the electronic structures of solids and to apply it to characterize defect dusters consisting of a few to hundreds atoms in metal oxides and ceramic materials. As results we obtained the following achievements :1.Instrumental development1.1 Development of a new TEM specimen holder for detecting cathodoluminescence1.2 Development of wavelength dispersive x-ray analysis spectrometer with grazing incidence configuraion1.3 Equipment with hollow-cone illumination system in TEM2.Development of new analytsis methods for electron spectroscopy2.1 Advanced analysis of extended energy loss fine structure (Reverse Monte Carlo analysis, time-resolved measurements, introduction of wavelet transformation)2.2 Extraction of medium range order of disordered structures by fluctuation electron microscopy2.3 Theoretical simulations of energy loss near edge structure by first principle quantum chemistry calculations2.4 Development of combined method of nanoindentation and finite element method for measuring mechanical properties of ceramics under irradiation3.Applications3.1 Detection of very small defect clusters and structural analysis of impurity oxygen defect complex3.2 Characterization of gas ion irradiation induced blisters on ceramics surfaces3.3 Analysis of hydrogen in hydrogenated nanostructured graphite3.4 Analysis of electronic structures of promoter ceramic in catalysis for purifying automotive gas emission

该项目旨在开发一种复杂的电子能谱仪 TEM，用于探索固体的电子结构，并将其应用于表征金属氧化物和陶瓷材料中由几个到数百个原子组成的缺陷簇。结果我们取得了以下成果：1.仪器研制1.1用于检测阴极发光的新型TEM样品架的研制1.2掠入射配置的波长色散X射线分析光谱仪的研制1.3TEM2中空心锥照明系统的设备.电子能谱新分析方法的发展2.1扩展能量损失精细结构的高级分析（逆蒙特卡罗分析、时间分辨测量、简介小波变换）2.2 利用涨落电子显微镜提取无序结构的中程有序2.3 通过第一原理量子化学计算对边缘结构附近的能量损失进行理论模拟2.4 开发纳米压痕与有限元法相结合的力学性能测量方法辐照陶瓷3.应用3.1 非常小的缺陷簇的检测和杂质氧缺陷复合体的结构分析3.2 陶瓷表面气体离子辐照引起的气泡的表征3.3 氢化物中氢的分析纳米结构石墨3.4 汽车尾气净化催化促进剂陶瓷电子结构分析

项目成果

Surface blistering of ion irradiated SiC studied by grazing incidence electron microscopy

• DOI: 10.1016/s0022-3115(02)01271-0
• 发表时间: 2002-12
• 期刊: Journal of Nuclear Materials
• 影响因子: 3.1
• 作者: S. Igarashi;S. Muto;T. Tanabe

J.Asamai, S.Muto, T.Tanabe: "Chemical effects of hydrogen on surface damaging process in gas-ion irradiated alumina"Surface and Coatings Technology. Vol.158-159C. 518-521 (2002)

J.Asamai、S.Muto、T.Tanabe：“氢对气体离子辐照氧化铝表面损伤过程的化学影响”表面和涂层技术。

In-situ Observation of Surface Blistering in Silicon by Deuterium and Helium Ion Irradiation

氘和氦离子辐照原位观察硅表面起泡

• 发表时间: 2002
• 期刊: Surface and Coatings Technology 158-159C
• 作者: S.Igarashi;S.Muto;T.Tanabe;J.Aihara;K.Hojou
• 通讯作者: K.Hojou

S.Muto, T.Tanabe: "Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials : its applicability"Journal of Electron Microscopy. Vol.52(印刷中). (2003)

S.Muto，T.Tanabe：“四面体配位材料无序结构的扩展能量损失精细结构的逆蒙特卡罗分析：其适用性”电子显微镜杂志第 52 卷（出版中）。

Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials

四面体配位材料无序结构扩展能量损失精细结构的逆蒙特卡罗分析

• 发表时间: 2003
• 期刊: Journal of Electron Microscopy 52
• 作者: S.Muto;T.Tanabe
• 通讯作者: T.Tanabe