Nature and structure of sub-nanometer defects in metal oxides by complex electron spectro-microscopy

通过复杂电子能谱显微镜研究金属氧化物中亚纳米缺陷的性质和结构

• 批准号: 14350340
• 负责人: MUTO Shunsuke
• 金额: $ 10.69万
• 依托单位: Nagoya University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (B)
• 财政年份: 2002
• 资助国家: 日本
• 起止时间: 2002 至 2004
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-14350340/
• 关键词: transmission electron microscopy; electron energy loss spectroscopy; wavelength-dispersive x-ray analysis; cathodoluminescence; defect clusters; first-principle electronic state calculation; light elements analysis; metal oxides; 透過型電子顕微鏡; 酸素複合欠陥

This project aims to develop a complex electron spectroscope TEM for exploring the electronic structures of solids and to apply it to characterize defect dusters consisting of a few to hundreds atoms in metal oxides and ceramic materials. As results we obtained the following achievements :1.Instrumental development1.1 Development of a new TEM specimen holder for detecting cathodoluminescence1.2 Development of wavelength dispersive x-ray analysis spectrometer with grazing incidence configuraion1.3 Equipment with hollow-cone illumination system in TEM2.Development of new analytsis methods for electron spectroscopy2.1 Advanced analysis of extended energy loss fine structure (Reverse Monte Carlo analysis, time-resolved measurements, introduction of wavelet transformation)2.2 Extraction of medium range order of disordered structures by fluctuation electron microscopy2.3 Theoretical simulations of energy loss near edge structure by first principle quantum chemistry calculations2.4 Development of combined method of nanoindentation and finite element method for measuring mechanical properties of ceramics under irradiation3.Applications3.1 Detection of very small defect clusters and structural analysis of impurity oxygen defect complex3.2 Characterization of gas ion irradiation induced blisters on ceramics surfaces3.3 Analysis of hydrogen in hydrogenated nanostructured graphite3.4 Analysis of electronic structures of promoter ceramic in catalysis for purifying automotive gas emission

该项目旨在开发一个复杂的电子光谱tem，以探索固体的电子结构，并将其应用于在金属氧化物和陶瓷材料中包含几到数百个原子的缺陷dusters。结果，我们获得了以下成就：1。开发1.1开发用于检测降压发光的新型TEM样品持有器1.2开发波长分散X射线分析光谱仪配置构型构型构型构型构型构型构型构型构型构型1.3设备具有空心孔的微照明系统，用于teme tem的范围较高的分析。蒙特卡洛分析，时间分辨的测量，小波转化的引入）2.2通过波动电子显微镜提取无序结构的中等范围顺序。和杂质氧缺陷复合物的结构分析3.2陶瓷表面上气体离子辐照诱导的水泡的表征3.3分析氢化纳米结构石墨中的氢的分析3.4催化剂陶瓷电气结构的分析，用于纯化自动气体气体发射

项目成果

Surface blistering of ion irradiated SiC studied by grazing incidence electron microscopy

• DOI: 10.1016/s0022-3115(02)01271-0
• 发表时间: 2002-12
• 期刊: Journal of Nuclear Materials
• 影响因子: 3.1
• 作者: S. Igarashi;S. Muto;T. Tanabe

In-situ Observation of Surface Blistering in Silicon by Deuterium and Helium Ion Irradiation

氘和氦离子辐照原位观察硅表面起泡

• 发表时间: 2002
• 期刊: Surface and Coatings Technology 158-159C
• 作者: S.Igarashi;S.Muto;T.Tanabe;J.Aihara;K.Hojou
• 通讯作者: K.Hojou

J.Asamai, S.Muto, T.Tanabe: "Chemical effects of hydrogen on surface damaging process in gas-ion irradiated alumina"Surface and Coatings Technology. Vol.158-159C. 518-521 (2002)

J.Asamai、S.Muto、T.Tanabe：“氢对气体离子辐照氧化铝表面损伤过程的化学影响”表面和涂层技术。

S.Muto, T.Tanabe: "Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials : its applicability"Journal of Electron Microscopy. Vol.52(印刷中). (2003)

S.Muto，T.Tanabe：“四面体配位材料无序结构的扩展能量损失精细结构的逆蒙特卡罗分析：其适用性”电子显微镜杂志第 52 卷（出版中）。

Reverse Monte Carlo analysis of extended energy-loss fine structure for disordered structures of tetrahedrally co-ordinated materials

四面体配位材料无序结构扩展能量损失精细结构的逆蒙特卡罗分析

• 发表时间: 2003
• 期刊: Journal of Electron Microscopy 52
• 作者: S.Muto;T.Tanabe
• 通讯作者: T.Tanabe