MRI: Acquisition of a Hard X-ray PhotoElectron Spectroscopy (HAXPES) for the Institute for Materials Research (IMR) at Binghamton University (BU)

MRI：为宾厄姆顿大学 (BU) 材料研究所 (IMR) 购买硬 X 射线光电子能谱 (HAXPES)

• 批准号: 1919704
• 负责人: Louis Piper
• 金额: $ 123.2万
• 依托单位: SUNY at Binghamton
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2019
• 资助国家: 美国
• 起止时间: 2019-09-01 至 2022-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1919704&HistoricalAwards=false
• 关键词: MRI; Acquisition; Hard; ray; PhotoElectron

The chemical and electronic properties of a solid can be measured non-destructively by analyzing the velocity of escaping electrons ejected from the material excited by X-rays. For most commercial laboratory-based soft X-ray sources, the majority of escaping electrons come from the topmost layers of the material making it a sensitive probe of the surface chemistry. Although surfaces are extremely important for many applications in catalysts and electronic devices, the chemistry at the surface is often distinctly different from the bulk underneath. Employing harder X-rays increases the percentage of electrons escaping from deeper within the material, but such bulk studies have thus far been limited to dedicated National facilities. Recent advances in new high-performance hard X-ray sources and detectors enable comparable bulk-sensitive measurements within a university laboratory setting thereby presenting a cost-effective means of increasing access to this emerging technique. The increased non-destructive chemical depth-profiling enables new insight into how buried layers within real device architectures evolve during operation, such as transistors, solar cells and batteries. The new instrument is accessible for academic and industry users across the U.S.A. The project integrates the instrument into various existing recruitment and educational programs at Binghamton University for increasing STEM retention and developing the workforce in next-generation technologies for energy harvesting, storage and efficiency.This project provides a novel laboratory-based HArd X-ray Photoelectron Spectroscopy (HAXPES) system for non-destructive chemical analysis of real materials and devices at Binghamton University. HAXPES studies at Synchrotron facilities are capable of precise chemical and electronic measurements at previously inaccessible regions of real materials and devices. The laboratory-based HAXPES instrument consists of a novel monochromatic Ga K-edge liquid jet x-ray source (9.25 KeV) enabling core and valence band studies with sampling depths up to 60 nm. This instrument dramatically increases access to this technique beyond the handful of Synchrotron-based HAXPES systems currently operational worldwide. Working with Federally funded centers at Binghamton and partnering institutions across the U. S. A. (both academic and industrial) this project is developing in-situ and operando HAXPES capabilities for studying active layers and buried contacts within next-generation transistors and (photo-)electrochemical cells during their operation. The HAXPES instrument is housed in a dedicated user facility for access to wider scientific community. The HAXPES system is integrated into several educational and training programs at Binghamton, including an undergraduate course examining the aesthetics of archeological artifacts within the context of their chemical and physical properties.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

通过分析 X 射线激发的材料中逸出电子的速度，可以无损地测量固体的化学和电子特性。对于大多数基于商业实验室的软 X 射线源，大部分逃逸电子来自材料的最顶层，使其成为表面化学的敏感探针。 尽管表面对于催化剂和电子设备中的许多应用极其重要，但表面的化学性质通常与下面的本体明显不同。 使用更强的 X 射线可以增加从材料深处逃逸的电子的百分比，但此类批量研究迄今为止仅限于专用的国家设施。新型高性能硬 X 射线源和探测器的最新进展使得能够在大学实验室环境中进行类似的体敏感测量，从而提供了一种经济有效的方法来增加对这一新兴技术的使用。增强的非破坏性化学深度分析使我们能够对晶体管、太阳能电池和电池等实际器件架构中的埋层在运行过程中如何演变产生新的见解。该新仪器可供美国各地的学术和行业用户使用。该项目将该仪器整合到宾厄姆顿大学现有的各种招聘和教育计划中，以提高 STEM 保留率并培养下一代能量收集、存储和效率技术的劳动力。该项目为宾厄姆顿大学提供了一种新型的基于实验室的硬 X 射线光电子能谱 (HAXPES) 系统，用于对真实材料和设备进行无损化学分析。 同步加速器设施的 HAXPES 研究能够对真实材料和设备以前无法到达的区域进行精确的化学和电子测量。 基于实验室的 HAXPES 仪器由新型单色 Ga K 边缘液体喷射 X 射线源 (9.25 KeV) 组成，可进行核心和价带研究，采样深度高达 60 nm。 该仪器极大地增加了对该技术的使用，超越了目前在全球范围内运行的少数基于同步加速器的 HAXPES 系统。 该项目与宾厄姆顿的联邦资助中心以及美国各地的合作机构（学术和工业）合作，正在开发原位和操作 HAXPES 功能，用于研究下一代晶体管和（光）电化学电池中的有源层和埋入触点他们的操作。 HAXPES 仪器安装在专用用户设施中，以便接触更广泛的科学界。 HAXPES 系统已融入宾厄姆顿的多个教育和培训项目，包括在化学和物理特性的背景下检查考古文物美学的本科课程。该奖项反映了 NSF 的法定使命，并通过使用评估方法进行评估，认为值得支持。基金会的智力价值和更广泛的影响审查标准。

项目成果

Surface Chemistry Dependence on Aluminum Doping in Ni-rich LiNi0.8Co0.2−yAlyO2 Cathodes

富镍 LiNi0.8Co0.2−yAlyO2 阴极中铝掺杂的表面化学依赖性

• DOI: 10.1038/s41598-019-53932-6
• 发表时间: 2019-12
• 期刊: Scientific Reports
• 影响因子: 4.6
• 作者: Lebens;Halat, David M.;Faenza, Nicholas V.;Wahila, Matthew J.;Mascheck, Manfred;Wiell, Tomas;Eriksson, Susanna K.;Palmgren, Paul;Rodriguez, Jose;Badway, Fadwa;et al
• 通讯作者: et al

Designing catalysts for water splitting based on electronic structure considerations

基于电子结构考虑设计水分解催化剂

• DOI: 10.1088/2516-1075/ab7d86
• 发表时间: 2020-04
• 期刊: Electronic Structure
• 影响因子: 2.6
• 作者: Razek, Sara Abdel;Popeil, Melissa R.;Wangoh, Linda;Rana, Jatinkumar;Suwandaratne, Nuwanthi;Andrews, Justin L.;Watson, David F.;Banerjee, Sarbajit;Piper, Louis F. J.
• 通讯作者: Piper, Louis F. J.

Laboratory-based Hard X-ray Photoelectron Spectroscopy for Fundamental and Industrial Research

用于基础和工业研究的实验室硬 X 射线光电子能谱

• DOI: 10.1380/vss.64.493
• 发表时间: 2021-01
• 期刊: Vacuum and Surface Science
• 作者: HASHIMOTO, Takahiro;AMANN, Peter;REGOUTZ, Anna;BARRETT, Nick;PIPER, Louis F.;HAMOUDA, Wassim;RENAULT, Olivier;LUNDWALL, Marcus;MACHIDA, Masatake
• 通讯作者: MACHIDA, Masatake