CDS&E: Resolving Nonlinearity in Thin Film Chemical Analysis: Roughening, Matrix Effects and Chemical Damage

CDS

基本信息

批准号：
1709667
负责人：
Lev Gelb
金额：
$ 34.5万
依托单位：
University of Texas at Dallas
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2017
资助国家：
美国
起止时间：
2017-09-01 至 2022-08-31
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=1709667&HistoricalAwards=false
关键词：
CDS&amp Resolving Nonlinearity Thin Film

项目摘要

This project is funded by the Chemical Measurement and Imaging program of the Chemistry Division. Professors Lev Gelb and Amy Walker of the University of Texas at Dallas are improving methods for interpreting surface chemical analysis data. Many methods for studying a surface or thin film involve blasting it with high-energy beams of electrons or ions. These approaches provide information about the atoms and molecules present, but also cause unwanted chemical reactions and surface roughening. This team is developing easy-to-use analysis software to account for these "nonlinear" effects. The result is that the quality of surface chemical analysis data is improved, and this advances research in fields ranging from energy, to electronics, to advanced materials, to biotechnology. Graduate and undergraduate students are trained in the critically important fields of surface characterization, data analysis, numerical methods, and high-performance computing. This project focuses on two types of nonlinearity in chemical imaging: quantitative modeling of matrix effects in secondary ion mass spectrometry (SIMS) imaging of organic surfaces, and resolution of chemical damage and roughening in x-ray photoelectron spectroscopy (XPS) depth profiling of complex oxides. Extraction of sample properties in the presence of these nonlinearities is addressed through physical modeling within a Bayesian framework, which is made possible through a combination of theoretical developments, modern computing power, improvements in experimental protocols, and physical understanding of the underlying phenomena. In order to promote the use and further development of advanced data analysis in chemical imaging, software developed in this project is freely distributed and promoted as a community resource, along with online exercises that illustrate its use and application. SIMS and XPS are widely used in many areas, so improving the performance of these and related techniques is a significant long-term benefit to society at large.

该项目由化学分部的化学测量和成像程序资助。德克萨斯大学达拉斯分校的Lev Gelb和Amy Walker教授正在改善解释表面化学分析数据的方法。许多研究表面或薄膜的方法都涉及用高能电子或离子爆炸。这些方法提供了有关存在的原子和分子的信息，但也会引起不必要的化学反应和表面粗糙。该团队正在开发易于使用的分析软件，以说明这些“非线性”效果。结果是提高了表面化学分析数据的质量，这进展了从能量，电子，到先进材料到生物技术的领域的研究。研究生和本科生在表面表征，数据分析，数值方法和高性能计算的至关重要的领域接受培训。该项目侧重于化学成像中的两种非线性：二级离子质谱（SIMS）成像中基质效应的定量建模，以及X射线光电学光谱（XPS）在复合氧化物的深度分析中的化学损伤和粗糙的分辨率。在存在这些非线性的情况下，通过在贝叶斯框架内的物理建模来提取样品特性，这是通过理论发展，现代计算能力，改善实验方案的改进以及对基本现象的物理理解的结合而实现的。为了促进化学成像中高级数据分析的使用和进一步开发，该项目开发的软件是自由分发和推广，作为社区资源，以及说明其使用和应用的在线练习。模拟人生和XP在许多领域被广泛使用，因此提高这些和相关技术的性能是整个社会的重要长期利益。

项目成果

期刊论文数量（3）

专著数量（0）

科研奖励数量（0）

会议论文数量（0）

专利数量（0）

Femtosecond laser desorption ionization mass spectrometry imaging and multivariate analysis of lipids in pancreatic tissue

胰腺组织脂质的飞秒激光解吸电离质谱成像及多变量分析

DOI：
10.1116/1.5016301
发表时间：
2018
期刊：
Biointerphases
影响因子：
2.1
作者：
Walker, Amy V.;Gelb, Lev D.;Barry, Grant E.;Subanajouy, Polatip;Poudel, Ananta;Hara, Manami;Veryovkin, Igor V.;Bell, Graeme I.;Hanley, Luke
通讯作者：
Hanley, Luke

Toward understanding weak matrix effects in TOF SIMS