Surface, Interface, and Bulk Electronic Structure of Nano-Scale Thin Film Organic Semiconductors

纳米级薄膜有机半导体的表面、界面和体电子结构

• 批准号: 0807368
• 负责人: Kevin Smith
• 金额: --
• 依托单位: Trustees of Boston University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2008
• 资助国家: 美国
• 起止时间: 2008-07-01 至 2011-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0807368&HistoricalAwards=false
• 关键词: Surface; Interface; Bulk; Electronic; Structure

In this research, supported by the Analytical and Surface Chemistry Program, a powerful combination of x-ray spectroscopies will be used to measure the surface, bulk and interface electronic structure of organic semiconductors. These new semiconductors are the subject of great interest due to the promise they hold for the development of advanced, flexible, carbon-based electronic devices. This program will measure the fundamental electronic properties of these materials in thin film form, as well as how they interact with their physical environment. It aims to produce definitive spectroscopic measurements of electronic structure in organic semiconductors which have hitherto been missing, and thus transform our understanding of such materials. This program will have broad impact in three areas. First, this project will have a significant impact on the education of students and postdoctoral research associates by exposing them to a highly collaborative research environment at national synchrotron radiation x-ray user facilities. Second, this program will have a broad impact on scientific infrastructure by supporting the full utilization of a state-of-the-art multi-technique x-ray spectrometer system. This apparatus is a significant infrastructure enhancement at a national user facility. Finally, this program is interdisciplinary and collaborative by its very nature. The successful application of these measurement techniques to organic systems will potentially have broad impact in a number of areas of chemistry, physics, materials science, and electrical engineering.

在这项研究中，在分析和表面化学计划的支持下，将使用X射线光谱镜的强大组合来测量有机半导体的表面，散装和界面电子结构。 这些新的半导体是引起人们极大的兴趣的主题，因为它们对开发高级，柔性，基于碳的电子设备的承诺有希望。 该程序将以薄膜形式来衡量这些材料的基本电子性能，以及它们如何与物理环境相互作用。 它的目的是在迄今缺少有机半导体中对电子结构的最终光谱测量，从而改变了我们对这种材料的理解。 该计划将在三个领域产生广泛的影响。 首先，该项目将通过将他们暴露于国家同步辐射X射线用户设施的高度协作研究环境中，对学生和博士后研究伙伴的教育产生重大影响。 其次，该计划将通过支持最先进的多技术X射线光谱仪系统的全面利用来对科学基础架构产生广泛的影响。 该设备是国家用户设施的重要基础设施。 最后，该计划本质上是跨学科和合作的。 这些测量技术成功地应用于有机系统，可能会在许多化学，物理，材料科学和电气工程领域产生广泛的影响。