STTR Phase I: Focused Ion Beam Fabricated Custom Probes for Superior Magnetic Force Microscopy of Recording Media

STTR 第一阶段：聚焦离子束制造的定制探针，用于记录介质的高级磁力显微镜

• 批准号: 0712445
• 负责人: Pablo Gomez
• 金额: $ 15万
• 依托单位: Nanomond Corporation
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-07-01 至 2008-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0712445&HistoricalAwards=false
• 关键词: STTR; Phase; Focused; Ion; Beam; STTR; Phase; Focused; Ion; Beam

This Small Business Technology Transfer Research (STTR) Phase I project is aimed at bringing magnetic force microscopy (MFM) for the data storage and memory applications to the next level of imaging thus turning MFM into a critical tool in the emerging era of nanomagnetic and Spintronics applications. The research will integrate cost-effective focused ion beam (FIB) based fabrication methods with micromagnetic field simulations to develop custom probes with superior properties as compared to conventional MFM probes. The following two goals will be pursued. First, research will be conducted to develop FIB-modified probes with the spatial resolution as small as 5 nm at room temperature. For comparison, today, the feature size resolved with MFM spans from 30 to 60 nm while the resolution of AFM is of the order of 1 nm. Second, a method to improve the quality of the information measured by MFM will be developed. The new ultra-high-resolution MFM will be able to measure not only the strength (as in conventional MFM) but also components of the field along selected directions. Micromagnetic simulations and the principle of Reciprocity will be used to predict FIB-based modifications to MFM probes necessary to satisfy certain custom requirements specific to certain applications.The span of MFM applications is truly diverse, from an accurate analysis of secret information by the FBI to a fundamental study of magnetostatic bacteria. Though all these applications will eventually benefit from this technology, the current emphasis will be placed on the magnetic data storage and memory applications where advancements in MFM could play a pivotal role in the development of next generation systems. Finally, the new ultra-high-resolution MFM could become a critical instrument for future Spintronics related applications. For example, the ability to provide unconventionally high resolution MFM images could shed light on the nanoscale properties of magnetic domains in the recording media and help the development of ultra-high density systems. As for the ability to measure the field orientation, this may become a truly unique imaging feature to characterize longitudinal and perpendicular magnetic storage media in which the stray field orientation represents the signature of each media type: the stray field measured from the bit transitions is predominantly perpendicular to the plane or along the track in longitudinal and perpendicular media, respectively. In summary, the proposed interdisciplinary integration approach may lead to the creation of ultra-high-resolution MFM with unique features critical for future data storage and memory related applications.

这项小型企业技术转移研究（STTR）I期项目旨在将数据存储和内存应用程序的磁力显微镜（MFM）带到下一个成像级别，从而将MFM变成了纳米磁和Spintronics应用的新兴时代的关键工具。该研究将将基于成本效益的关注离子束（FIB）的制造方法与微磁场模拟相比，与传统的MFM探针相比，开发具有出色特性的自定义探针。将实现以下两个目标。首先，将进行研究，以开发室温下的空间分辨率为5 nm的空间分辨率。为了进行比较，今天，MFM跨度从30到60 nm解决的特征大小，而AFM的分辨率为1 nm。其次，将开发提高MFM测量信息质量的方法。新的超高分辨率MFM将不仅能够测量（如常规MFM），还可以沿选定的方向测量该场的组成部分。微磁模拟和互惠原理将用于预测基于FIB的修改，以满足某些应用特定的某些自定义要求所需的MFM探针。从FBI对秘密信息的准确分析到磁抑制细菌的基本研究，MFM应用程序的跨度确实是多种多样的。尽管所有这些应用程序最终都将从这项技术中受益，但当前的重点将放在磁数据存储和内存应用程序上，其中MFM的进步可能在下一代系统的开发中起关键作用。最后，新的超高分辨率MFM可能成为将来与Spintronics相关的应用的关键工具。例如，提供不常规的高分辨率MFM图像的能力可以阐明记录介质中磁域的纳米级特性，并有助于开发超高密度系统。至于测量现场取向的能力，这可能成为表征纵向和垂直磁性存储媒体的真正独特的成像功能，其中流浪场取向代表了每种媒体类型的签名：从位过渡中测量的杂散场是垂直于飞机或沿纵向和垂直媒体的轨道沿轨道垂直的。总而言之，拟议的跨学科整合方法可能会导致创建超高分辨率的MFM，其独特功能对于将来的数据存储和与内存相关的应用程序至关重要。