Acquisition of a Field Emission Scanning Electron Microscope (FESEM) to Enhance Research and Education in Engineered Particulates

购买场发射扫描电子显微镜 (FESEM) 以加强工程颗粒的研究和教育

• 批准号: 0116595
• 负责人: Rajesh Dave
• 金额: $ 33.75万
• 依托单位: New Jersey Institute of Technology
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2001
• 资助国家: 美国
• 起止时间: 2001-08-01 至 2004-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0116595&HistoricalAwards=false
• 关键词: Acquisition; Field; Emission; Scanning; Electron

OIA-0116595PI: DaveAbstractThe PI and four colleagues in the Mechanical Engineering and the Chemical Engineering Departments request funding for the purchase of a field emission scanning electron microscope (FESEM). This instrument will be used in their research in particle technology. It will enhance their capability to characterize particles at nano and submicron scales. When such data are incorporated into their predictive numerical model, better results are anticipated. The institutional support of NJIT is very strong with cost-sharing at ~50% level.

OIA-0116595PI：DaveAbstract机械工程和化学工程系的 PI 和四位同事请求资金购买场发射扫描电子显微镜 (FESEM)。 该仪器将用于他们的粒子技术研究。 它将增强他们在纳米和亚微米尺度上表征颗粒的能力。 当这些数据被纳入他们的预测数值模型时，预计会得到更好的结果。 NJIT 的机构支持非常强大，费用分摊水平约为 50%。