Acquisition of X-ray Diffraction Instrumentation for Materials Science Research

采购用于材料科学研究的 X 射线衍射仪器

• 批准号: 9977193
• 负责人: Stephen Burns
• 金额: $ 14.5万
• 依托单位: University of Rochester
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1999
• 资助国家: 美国
• 起止时间: 1999-09-01 至 2002-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9977193&HistoricalAwards=false
• 关键词: Acquisition; ray; Diffraction; Instrumentation; Materials

9977193BurnsFunds from the Major Research Instrumentation program will be used to acquire x-ray diffraction instrumentation consisting of an analytic materials research grade diffractometer fitted with primary beam optics and a lower resolution diffractometer outfitted with a dual furnace-cryostat attachment and a grazing incidence thin-film stage. This x-ray instrumentation will be used to characterize advanced imaging materials, including optical and electronic materials, thin films, coatings, and surface-polished or ground crystalline materials. The diffractometers are the Philips Materials Research Diffractometer and Multi-Purpose Diffractometer instruments. A materials research diffractometer with a very high resolution, horizontal goniometer and a heavy duty Eulerian cradle with capability for texture analysis, high-angle residual-stress analysis, layered and in-plane MBE strain and structure analysis are proposed. The key aspect of this equipment will be the capability to obtain structure sensitive data on thin-films, MBE layers, residual-stresses, ground and polished crystalline surfaces and texture analyses which can not be conducted at the University of Rochester today because of lack of instrumentation. Data obtained from these analyses is essential for understanding and controlling the microstructure, properties and performance of existing materials and to design new materials and processes. The research conducted on this instrument will be performed by investigators in several departments. Students working on these project will be exposed to cutting-edge research in materials of great technological importance.X-ray diffraction instrumentation for materials research will be acquired with funds from the Major Research Instrumentation program. The impact on the research infrastructure at the University of Rochester will be great not only on the types of projects that will use the instrument, but also on the research training of students on this state-of-the-art system.

9977193来自主要研究仪器计划的Burns资金将用于购买X射线衍射仪器，包括配备主束光学器件的分析材料研究级衍射仪和配备双炉低温恒温器附件和掠入射薄膜的低分辨率衍射仪阶段。 该 X 射线仪器将用于表征先进成像材料，包括光学和电子材料、薄膜、涂层以及表面抛光或研磨晶体材料。衍射仪是飞利浦材料研究衍射仪和多功能衍射仪仪器。 提出了一种具有非常高分辨率的材料研究衍射仪、水平测角仪和重型欧拉支架，具有纹理分析、高角度残余应力分析、分层和面内 MBE 应变和结构分析的能力。 该设备的关键方面是能够获得薄膜、MBE 层、残余应力、研磨和抛光晶体表面以及纹理分析的结构敏感数据，而这些数据目前在罗切斯特大学无法进行，因为缺乏仪器仪表。 从这些分析中获得的数据对于理解和控制现有材料的微观结构、特性和性能以及设计新材料和工艺至关重要。 对该仪器进行的研究将由多个部门的研究人员进行。 从事这些项目的学生将接触到具有重大技术重要性的材料的前沿研究。用于材料研究的 X 射线衍射仪器将由重大研究仪器计划的资金购买。 对罗切斯特大学研究基础设施的影响不仅对使用该仪器的项目类型产生巨大影响，而且对学生使用这一最先进系统的研究培训也产生巨大影响。