Near-Field Scanning Optical Microscopy Studies of Luminescent Polymer/Metal Interfaces

发光聚合物/金属界面的近场扫描光学显微镜研究

• 批准号: 9800484
• 负责人: David Vanden Bout
• 金额: $ 4万
• 依托单位: University of Texas at Austin
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1998
• 资助国家: 美国
• 起止时间: 1998-01-15 至 1999-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9800484&HistoricalAwards=false
• 关键词: Near; Field; Scanning; Optical; Microscopy

This starter grant award of the Chemistry Division to the University of Texas at Austin supports the research of Professor David A. Vanden Bout. The theme of the research is the effects of interfacial chemistry and material heterogeneities on electronic and optical properties of luminescent conjugated polymers at metal interfaces. Near-field scanning optical microscopy (NSOM) combined with time-resolved spectroscopy will be used to probe polymer/metals interfaces directly. The NSOM will be coupled with ultrafast laser spectroscopy to include time-resolved measurements of the optical properties. Properties of particular interest include the migration and trapping of energy and fundamental excitations as well as localized photochemistry. Although inexpensive and reliable organic electronic devices have existed for years, poor durability and short lifetimes have limited the success of these devices. By probing the small region of polymer/metal interfaces directly, these studies will yield new insight into the workings and failures of organic devices such as polymer light-emitting diodes.

德克萨斯大学奥斯汀分校化学系的启动资金支持 David A. Vanden Bout 教授的研究。 该研究的主题是界面化学和材料异质性对金属界面发光共轭聚合物的电子和光学性质的影响。 近场扫描光学显微镜（NSOM）与时间分辨光谱相结合将用于直接探测聚合物/金属界面。 NSOM 将与超快激光光谱结合，以包括光学特性的时间分辨测量。 特别感兴趣的性质包括能量和基本激发的迁移和捕获以及局部光化学。 尽管廉价且可靠的有机电子器件已经存在多年，但耐用性差和寿命短限制了这些器件的成功。 通过直接探测聚合物/金属界面的小区域，这些研究将对聚合物发光二极管等有机器件的工作和故障产生新的见解。