基于半导体器件的宇宙空间粒子LET值谱测量方法研究

The space particle LET spectrum is an important parameter of radiation damage prediction and protection design of aerospace semiconductor devices and astronauts. The traditional measurement method is utilizing recoverable passive measurement or measurement of ion energy spectra by nuclear track detectors. The LET spectrum is obtained indirectly from the energy spectrum，therefore, this method has some limitations. This project will do some research on LET spectrum detection utilizing semiconductor devices, base on the relationship between Single Event Effects(SEE) on the device and the LET of incident ion. Through the researches on the relationship between charge collection and LET of incident ion, Single Event Upset and LET of incident ion, a method of LET spectrum detection and verifying will be established. This project is to establish theoretical and methodological basis for LET spectrum detection using low power, light weight, small size detection load system, and provide technical support for the exploration of space radiation environment and radiation protection.

空间高能粒子LET谱是对航天半导体器件及宇航员进行辐射损伤预估及防护设计的重要参量，传统的测量方法是通过核径迹探测器进行回收式被动测量或通过离子能谱测量间接获得LET谱信息，在实施和应用上具有一定局限性。本项目基于离子LET值与半导体器件单粒子效应的关联性，探索利用半导体器件进行空间高能粒子LET谱探测与检验的新方法，通过对入射离子LET值与器件收集电荷以及单粒子翻转（SEU）之间的依赖关系、电荷收集技术与SEU测量等基本问题的研究，建立基于半导体器件的LET谱测量与检验方法，为未来形成一种低功耗、轻量化、小型化的空间LET谱探测与检验技术及载荷建立理论及方法依据，为空间辐射环境的探测研究和辐射防护提供技术支撑。

空间高能粒子LET谱是对航天半导体器件及宇航员进行辐射损伤预估及防护设计的重要参 量，传统的测量方法是通过核径迹探测器进行回收式被动测量或通过离子能谱测量间接获 得LET谱信息，在实施和应用上具有一定局限性。本项目对一种基于电荷收集测试的在线测试方法进行了研究。对离子入射到不同特征尺寸、不同工艺类型器件中收集电荷量与离子LET值之间的关系、LET值谱测试方法、LET值谱验证方法等进行了研究，获得了不同类型器件中LET值与入射离子LET值的数值模拟数据，以及LET值谱测量和验证的实验数据，掌握了离子LET值谱测量与验证方法，为今后开展空间在轨LET值谱探测奠定了技术基础。

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