STEM-in-SEM: A Tool For the High Throughput Analytical Characterization of Materials at the Nanoscale

STEM-in-SEM：纳米尺度材料高通量分析表征的工具

• 批准号: 472524-2015
• 负责人: Sinclair, Chadwick
• 金额: $ 4.73万
• 依托单位: University of British Columbia
• 依托单位国家: 加拿大
• 项目类别: Research Tools and Instruments - Category 1 (<$150,000)
• 财政年份: 2015
• 资助国家: 加拿大
• 起止时间: 2015-01-01 至 2016-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=577927
• 关键词: STEM; SEM; Tool; Throughput; Analytical

This proposal seeks funds for a scanning transmission electron microscopy (STEM) detector and ancillary equipment. This equipment will be used in conjunction with our existing high resolution field emission gun scanning electron microscope in the multidisciplinary AMPEL Electron Microscopy User Facility. This STEM-in-SEM detector, along with the associated mechanical noise cancellation system, will have a major impact on the ability of UBC researchers to study materials at the nanometric scale. As UBC is currently without an analytical transmission electron microscope, the proposed STEM-in-SEM detector will provide the only capacity at UBC for researchers to both observe and perform nanoscale chemical analysis on inorganic materials. This will greatly accelerate new developments in both carbon nanostructures for electronics as well as nanoscale precipitation control in structural alloys. It will also provide researchers at UBC a tool that can bridge, at higher throughput and lower cost, higher resolution experiments at specialized facilities such as the Canadian Centre for Electron Microscopy at McMaster University.

该提案寻求用于扫描传输电子显微镜（STEM）检测器和辅助设备的资金。 该设备将与我们现有的高分辨率场发射枪扫描电子显微镜一起使用，该设备将在多学科AMPEL电子显微镜用户设施中使用。 该茎中的检测器以及相关的机械噪声消除系统将对UBC研究人员以纳米级研究材料的能力产生重大影响。 由于UBC目前没有分析传输电子显微镜，因此提出的拟议的词干检测器将为UBC提供唯一的能力，以使研究人员对无机材料进行观察和进行纳米级化学分析。 这将极大地加速用于电子产品的碳纳米结构以及结构合金中的纳米级沉淀。 它还将为UBC的研究人员提供一个工具，该工具可以在麦克马斯特大学（McMaster University）的加拿大电子显微镜等专业设施上以较高的吞吐量和更低的成本进行更高的分辨率实验。