Nanometer-resolved in situ observation of surface plasmons based on enhanced electron emission

基于增强电子发射的表面等离子体激元纳米分辨原位观测

• 批准号: 23651121
• 负责人: MIYAZAKI Hideki
• 金额: $ 2.5万
• 依托单位: National Institute for Materials Science
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Challenging Exploratory Research
• 财政年份: 2011
• 资助国家: 日本
• 起止时间: 2011 至 2012
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-23651121/
• 关键词: ナノ計測; 電子顕微鏡; 光物性; 表面・界面物性; 可視化

We have tackled the development of a novel microscopy to visualize surface plasmon intensity on a metal surface with nanometeric resolution on the basis of the secondary electron emission enhancement effect. An optical system, in which surface plasmon is excited on a metal thin film deposited on a prism by laser light supplied from outside, was constructed in the specimen chamber of a scanning electron microscope (SEM). Intensity change in the SEM image corresponding to the laser power was observed.

我们已经解决了新型显微镜的开发，以根据二级电子发射增强效果可视化具有纳米分辨率的金属表面上的表面等离子体强度。在扫描电子显微镜（SEM）的样品室中构建了一个光学系统，其中构造了从外部提供的激光光（SEM）的表面等离子体上的表面等离子体。观察到与激光功率相对应的SEM图像的强度变化。