Cross-sectional magnetic domain analysis by three-dimensional magnetic charge distribution measurement in magnetic thin films

通过磁性薄膜中三维磁荷分布测量进行横截面磁畴分析

• 批准号: 12650048
• 负责人: SAITO Hitoshi
• 金额: $ 1.79万
• 依托单位: Faculty of Engineering and Resource Science, Akita University
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for Scientific Research (C)
• 财政年份: 2000
• 资助国家: 日本
• 起止时间: 2000 至 2001
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-12650048/
• 关键词: magnetic force microscope; microscopic magnetic domain structure; magnetic recording media

In order to improve the recording density for recent high density magnetic recording media, the observation and control of magnetic domain structure for these films in not only the film plain direction but also the cross-sectional direction of films is strongly needed, because of the reduction of medium noise due to tlie fluctuation of magnetization. In the present study, the method of three-dimensional magnetic charge distribution measurement in magnetic thin films by using magnetic force microscope (MFM) was investigated. The following results are obtained.1) Three-dimensional magnetic chargedistribution measurement is possible in the case that the resolution of MFM is limited by the digitizing resolution of the input signals in MFM. This measurement can be done by subtracting the experimentally obtained MFM signals from the transformed MFM signals with same tip-sample distance to which are transformed from the signals measured at different tip-sample distance by MFM signal transformation method. This method is verified by computer simulation2) For three-dimensional magnetic charge distribution measurement, the MFM tip whose magnetic direction does not change by the stray field of MFM samples at short tip-sample distance is needed. We developed high coercivity MFM tips coated by sputtered L10 ordered CoPt films with Hc = 14kOe.3) For three-dimensional magnetic charge distribution measurement, it is important to know the MFM tip magnetization. Therefore we developed the method of in-situ magnetic hysteresis measurement of MFM tips by detecting the alternating force of MFM tips with applying alternating magnetic field to MFM tips.4) The improvement of MFM resolution is effective for three-dimensional magnetic charge distribution measurement. We developed the high-resolution MFM with 10 nm resolution by increasing the dynamic range of MFM input signals and using Lock-in amplifier to reduce signal noise.

为了改善最近高密度磁记录介质的记录密度，由于磁化磁化的波动降低了中等噪声，因此强烈需要这些薄膜的磁性域结构的观察和控制。在本研究中，研究了使用磁力显微镜（MFM）在磁性薄膜中三维磁电荷分布测量的方法。 1）在MFM的分辨率受到MFM中输入信号的数字化分辨率限制的情况下，可以获得三维磁性加电测量。可以通过从转换后的MFM信号中减去实验获得的MFM信号来完成此测量，这些信号从相同的尖端样本距离中从通过MFM信号转换方法下在不同尖端样本距离下测得的信号转换。通过计算机模拟验证了此方法2）用于三维磁电荷分布测量值，MFM尖端的磁方向不会因短尖端样本距离的MFM样品的流量而变化。我们开发了高矫顽力的MFM TIPS，该尖端由溅射的L10有序的Copt膜涂有HC = 14KOE.3）用于三维磁电荷分布测量，重要的是要了解MFM尖端磁化非常重要。因此，我们通过检测MFM TIPS的交替力，将交替的磁场应用于MFM TISP。我们通过增加MFM输入信号的动态范围并使用锁定放大器来减少信号噪声，从而开发了具有10 nm分辨率的高分辨率MFM。

项目成果

S.Asakura, S.Ishio, A.Okada, H.Saito: "Magnetic Domain Percolation of Co_x(SiO_2)_<100-x> Granular Films"J. Magn. Magn. Mater. (In Press). (2002)

S.Asakura，S.Ishio，A.Okada，H.Saito：“Co_x(SiO_2)_<100-x>颗粒薄膜的磁畴渗流”J。

H. Ito: "Magnetic Properties of Co-Pt Thin Prepared by Sputtering Method and Applicatibn to MFM Tips"J. Soc. of Mater. Engin. for Resources of Jpn.. 19. 18-22 (2000)

H. Ito：“溅射法制备的Co-Pt薄层的磁性及其在MFM尖端的应用”J。

S.Tbmino: "Ferromagnetic Dot Formation in Nonmagnetic Amorphous FeZr Films by Nbn-Contact Atomic Force Microscope"J. Magn, Magn. Mater.. 212. 69-74 (2000)

S.Tbmino：“通过 Nbn 接触原子力显微镜在非磁性非晶 FeZr 薄膜中形成铁磁点”J。

S.Ishio: "Magnetic anisotropy field H-k and domain structure in L1_0 Fe_xPt_<1-x> films"J. Magn. Magn. Mater. 235. 148-152 (2001)

S.Ishio：“L1_0 Fe_xPt_<1-x> 薄膜中的磁各向异性场 H-k 和磁畴结构”J。

S.Ishlo: "Giant magnetoresistive effect in L1_0 ordered FePt films"J. Magn. Mater. (in press). (2002)

S.Ishlo：“L1_0 有序 FePt 薄膜中的巨磁阻效应”J。