Research on the Semiconductor Based Optical Detector for the Short-Wavelength Visible and Ultra-Violet Region.

短波长可见光和紫外区半导体光学探测器的研究。

基本信息

  • 批准号:
    08650015
  • 负责人:
  • 金额:
    $ 1.15万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 财政年份:
    1996
  • 资助国家:
    日本
  • 起止时间:
    1996 至 1997
  • 项目状态:
    已结题

项目摘要

We have performed this reserch project with focussing our attentions onto four fundamental key-technologies : (i) precise controling of hetero-interfaces (ZnSe-ZnSe, ZnSeZnMgSSe systems) in MBE growth, (ii) p and n type conduction control, (iii) high quality semi-insulating ZnSe layr (active layr in device), and (iv) perfect ohmic contact layr of ZnTe-Zn-Se super lattice (SLS). Concerning the MBE growth techniques, following high quality film growth conditions are established : (1) High resistive active layr (i-layr) of ZnSe : this active layr plays a role of active layr in PiN structure optical detectors and we have established the high quality i-layr with defect density of less than 10^<13>cm^<-3>. (2) SLS contact layr : almost perfect SLS ohmic contact layr (ZnTe-ZnSe superl-lattice) with the contact resistance of less than 0.1 (ohm cm^2) is realized by adjusting the N-doping conditions in MBE growth.Based on these techniques established here, we have fabricated Heter-Structure PiN optical detectors (SLS-pZnSSe-iZnSe-nZnSe on nGaAs). Tentative performance of the PiN photo-diodes are followings : (a) Quantum Efficiency=50-60% (for light wavelength region of 460-400nm), (b) dark current=0.9-0.1 nA/cm^2 at V=20 V (this value is about one order smaller in magnitudes than the cace of Si PiN diode). As described above, this research has demonstrated a very high potential of the II-VI (ZnSe) based PiN photo-diode by MBE growth for the future short wavelength visible and ultra-violet optical regions.
We have performed this reserch project with focussing our attentions onto four fundamental key-technologies : (i) precise controling of hetero-interfaces (ZnSe-ZnSe, ZnSeZnMgSSe systems) in MBE growth, (ii) p and n type conduction control, (iii) high quality semi-insulating ZnSe layr (active layr in device), and (iv) perfect ohmic contact layr of Znte-Zn-se超级晶格(SLS)。关于MBE生长技术,建立了高质量的膜生长条件:(1)ZNSE的高电阻活性主动层(I-layr):该活性LAIR在PIN结构光学检测器中起着活性Layr的作用,我们确定了具有小于10^<13> cm^<13> cm^<-3>的高质量I-Layr。 (2)SLS接触Layr:通过调整MBE增长中的N兴奋剂条件,可以实现几乎完美的SLS欧姆接触Layr(Znte-Znse superl-lattice(Znte-Znse superl-lattice),其接触抗性小于0.1(ohm cm^2)可以实现。销照片二二极管的暂定性能如下:(a)量子效率= 50-60%(对于460-400nm的光波长区域),(b)暗电流= 0.9-0.1 na/cm^2在v = 20 v时(此值比Si Pin diode的尺寸小于一个级数)。如上所述,这项研究表明,II-VI(ZNSE)基于MBE的PIN二极管具有很高的潜力,用于未来的短波长可见和超紫罗莱ac光学区域。

项目成果

期刊论文数量(14)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Koshi Ando: "Deep Level Characteristics of II-VI and III-V Wide Bandgap Laser Materials" International Symposium on Blue Laser and Light Emitting Diodes Chiba,Japan,March 5-7(1996). L1-L3 (1996)
Koshi Ando:“II-VI 和 III-V 宽带隙激光材料的深层次特性”蓝色激光和发光二极管国际研讨会,日本千叶,3 月 5-7 日(1996 年)。
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K.Ando 他: "Deep befect center characteristics of wide-dandgap II-VI and III-V blue laser materials" Proceedings of SPIE (1998,Jan.26-29 ; San Jonse Ca.U.S.A). (印刷中). (1998)
K.Ando 等人:“宽间隙 II-VI 和 III-V 蓝色激光材料的深部缺陷中心特性”SPIE 会议记录(1998 年,1 月 26-29 日;San Jonse Ca.U.S.A)(出版中)。 1998)
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T.Yamaguchi, K.Ando 他: "Shallow-Deep Transition of Nitrogen Acceptor in Blue Semiconductor Laser Material ZnMgSSe" Extended Abstracts,1997 Int.Conf.on Solide State Devices and Materials(SSDM).C-5-8. 202-203 (1997)
T.Yamaguchi、K.Ando 等人:“蓝色半导体激光材料 ZnMgSSe 中氮受体的浅-深转变”扩展摘要,1997 Int.Conf.on Solide State Devices and Materials (SSDM).C-5-8。 202-203(1997)
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K.Ando, T.Yamaguchi, K.Koizumi, T.Abe H.Kasada, A.Ishibashi, K.Nakano and S.Nakamura: "Deep defect center characteristics of wide-bandgap II-VI and III-V blue laser materials" Proceedings of SPIE Int.Symp.on Optoelectronics. (in press). (1998)
K.Ando、T.Yamaguchi、K.Koizumi、T.Abe H.Kasada、A.Ishibashi、K.Nakano 和 S.Nakamura:“宽带隙 II-VI 和 III-V 蓝色激光材料的深缺陷中心特性
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    0
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安東 孝止: "II-VI及びIII-V青色レーザー結晶中の深い欠陥準位" 電子情報通信学会(信学技法)OPE96-131 LQE96-129. 1997-01. 13-18 (1997)
Takashi Ando:“II-VI 和 III-V 蓝色激光晶体中的深层缺陷水平”,电子、信息和通信工程师协会 (IEICE) OPE96-131 LQE96-129。
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ANDO Koshi其他文献

ANDO Koshi的其他文献

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{{ truncateString('ANDO Koshi', 18)}}的其他基金

Development of Primary-Secondary Air-Battery using Activated-Carbon made from Saw-dust under high temperature
高温锯末活性炭一二次空气电池的研制
  • 批准号:
    24655141
  • 财政年份:
    2012
  • 资助金额:
    $ 1.15万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Development of Ultraviolet APD Device by Widegap Semiconductors
宽禁带半导体公司开发紫外APD器件
  • 批准号:
    20560009
  • 财政年份:
    2008
  • 资助金额:
    $ 1.15万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Study on Degradation Mechanism of II-VI based blue-Green Laser Diodes
II-VI基蓝绿激光二极管的退化机理研究
  • 批准号:
    10650011
  • 财政年份:
    1998
  • 资助金额:
    $ 1.15万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
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