Development of an X-ray Poralimeter Using Direct X-ray Imaging CCD with Position, Energy and Time Resolution

使用具有位置、能量和时间分辨率的直接 X 射线成像 CCD 开发 X 射线偏振计

基本信息

批准号：
07554002
负责人：
TSUNEMI Hiroshi
金额：
$ 13.5万
依托单位：
OSAKA UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
1995
资助国家：
日本
起止时间：
1995 至 1996
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07554002/
关键词：
CCD X-ray Polarimeter Detection Efficiency X-ray Generator Depletion Layr Energy Resolution X-ray Astronomy X線発生装置 X線検出器偏光X線 X線検出

项目摘要

The purpose of this research project is to improve not only the fundamental properties of X-ray CCD but also as an X-ray polarimeter. The research group consists of the member s in Hamamatsu photnonics (HPK) and the members in Osaka university. According to the specification determined by all the members, the CCD chips were fabricated at HPK,and the university side operated and examined those chips.Several kinds of CCD chips using different material and production methods have been made. We got eventually energy resolution of 140 eV for 5.9 keV X-rays with a CCD chip of which pixel size is 12 mum and pixel number is 512x512. Although the resolution was 160 eV at the end of the first year in the research term, reduction of the dark current by 1/50 lead to the better resolution. Using high registivity material, we got a CCD chip of which depletion layr is as thick as 20 mum.University side activities include the development of CCD operation and evaluation ; 1) spectrometer system for measuing the CCD detection efficiency for 0.4-2.2keV X-rays, 2) CCD drive clock to suppress spurious charge noise, 3) high speed read-out system using DSP,4) simulation code for X-ray absorption and charge collection process within CCD.Adding these, we invented a novel method for measuring detection efficiency for sub-pixel size structure by employing a mesh in front of the CCD chip. We also measured polarization degree of the X-ray beam from a laboratory X-ray generator. CCD chips with pixel size of 6 mum, which should be effective for X-ray polarimetry, were started to fabricate. The polarimeter-capability of those small pixel size CCD will be measured within the year of 1997.

该研究项目的目的不仅是提高X射线CCD的基本特性，而且还提高X射线极化计的基本特性。研究小组由Hamamatsu光词（HPK）和大阪大学的成员组成。根据所有成员确定的规格，在HPK上制造了CCD芯片，大学方进行了操作和检查这些芯片。已经制作了使用不同材料和生产方法的CCD芯片。我们最终获得了5.9 keV X射线的140 eV的能量分辨率，其中像素尺寸为12妈妈，像素数为512x512。尽管该分辨率在研究术语的第一年结束时为160 eV，但将暗流减少1/50导致了更好的分辨率。使用较高的再生材料，我们得到了CCD芯片，其中耗竭的layr厚度为20 mum。 1) spectrometer system for measuing the CCD detection efficiency for 0.4-2.2keV X-rays, 2) CCD drive clock to suppress spurious charge noise, 3) high speed read-out system using DSP,4) simulation code for X-ray absorption and charge collection process within CCD.Adding these, we invented a novel method for measuring detection efficiency for sub-pixel size structure by employing a mesh in front of the CCD chip.我们还测量了实验室X射线发生器的X射线束的极化度。像素大小为6妈妈的CCD芯片开始制造，这对于X射线极化法应该有效。这些小像素大小CCD的偏振能力能力将在1997年内测量。