Generalization of X-ray microanalysis in analytical electron microscopy and its application to microstructure-controlled materials

分析电子显微镜中X射线微分析的推广及其在微结构控制材料中的应用

基本信息

批准号：
03650580
负责人：
NEMOTO Minoru
金额：
$ 1.34万
依托单位：
KYUSHU UNIVERSITY
依托单位国家：
日本
项目类别：
Grant-in-Aid for General Scientific Research (C)
财政年份：
1991
资助国家：
日本
起止时间：
1991 至 1992
项目状态：
已结题

项目摘要

It was shown that the analytical electron microscope equipped with an energy dispersive X-ray spectrometer(AEM-EDS)is useful for the evaluation of microstructure-controlled materials. 1. Generalization of AEM-EDS method. (1) It was recognized that the errors in k factors were larger with use of the standard bulk specimens than the standard thin-film specimens because the S/N ratio is smaller for the former. (2) A new form of the extrapolation method was presented.It permitted the analysis of a region equivalent to a focused beam size or of a specimen with a uniform thickness. (3) A rapid processing for X-ray absorption correction was presented.This involved use of the extrapolation method assisted by a computer-based system for analytical electron microscopy with a field emission gun. 2. Applications of AEM-EDS to microstructure-controlled materials. (1) The volume fraction of particles which is an important parameter for the strengthening of alloys containing fine dispersion of particles was determined by AEM-EDS.The differential X-ray absorption method was shown to be applicable to the thickness measurement of the two types of intermetallic compounds,Ni_3(Al,Ti)and TiAl,containing finely dispersed precipitate particles. (2) Phase equilibria between the gamma and gamma' phases in Ni-base Ni-Al-Ta alloys were studied.The chemical compositions of the gamma and gamma' phases in the two-phase alloys were determined by AEM-EDS.From the composition,it was possible to obtain the tie-lines for the gamma and gamma' phases and also the partitioning coefficients of Ta in the gamma' phase. (3) Observation and microanalysis were conducted across the interfaces of the diffusion couples,Ni/Ni_3Al and Ni_3Al/ NiAl.It was shown that the interdiffusivities obtained by AEM-EDS are consistent with those by an electron probe microanalyzer(EPMA).It was then demonstrated that the AEM-EDS is suitable for the diffusivity measurement at lower annealing temperatures.

结果表明，配备了能量色散X射线光谱仪（AEM-EDS）的分析电子显微镜对于评估微观结构控制的材料很有用。 1。AEM-EDS方法的概括。（1）人们认识到，使用标准散装样品的k因子中的误差要大于标准薄膜标本，因为前者的S/N比小。（2）提出了一种新形式的外推法。它允许对等效于聚焦梁大小或厚度均匀厚度的样品的区域进行分析。（3）提出了X射线吸收校正的快速处理。这涉及使用基于计算机的系统通过现场发射枪辅助进行的外推方法来分析电子显微镜。 2。在微结构控制的材料中应用AEM-EDS。（1）颗粒的体积分数，这是通过AEM-ED确定含有精细颗粒合金的合金的重要参数。显示差异X射线吸收方法适用于两种类型的金属层间化合物Ni_3（Al，Ti）和TiaL的厚度测量，含有颗粒剂，含有颗粒的颗粒。（2）研究了Ni-base Ni-Al-TA合金中γ和伽马相之间的平衡。研究了两相合金中γ和伽马相的化学组成，由AEM-ED确定。从组成中，可以为γ和γ酶的脉冲和伽马广告'和gamma's coefers contition Contion'和gam''进行启用。（3）进行观察和微分析在扩散夫妻的界面上进行，ni/ ni_3al和ni_3al/ nial.IT表明，通过AEM-EDS获得的互互相互构度与电子探针（EPMA）相一致，然后较低地证明了ANER的差异。