CCF: SHF: CORE: Small: Towards Systematic Quality Control of Physically Unclonable Functions (PUFs)

CCF：SHF：CORE：小型：迈向物理不可克隆功能（PUF）的系统质量控制

基本信息

批准号：
2244479
负责人：
Natasha Devroye
金额：
$ 59.95万
依托单位：
University of Illinois at Chicago
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2023
资助国家：
美国
起止时间：
2023-01-15 至 2025-12-31
项目状态：
未结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=2244479&HistoricalAwards=false
关键词：
CCF SHF CORE Small Towards

项目摘要

Physically Unclonable Functions (PUFs) are relatively new devices, often electronic, currently being designed and investigated for potential use as hardware security primitives for various security applications. Electronic PUFs work by exploiting some inherent randomness in the chip manufacturing process, which produces analog features with slight random variations that are combined to yield a digital function. This randomness, usually considered undesirable in traditional chip manufacturing processes, here is harnessed and, when coupled with an analog-to-digital process, realizes a "challenge-to-response" Boolean function. The hope is that each device's list of challenge-response-pairs (CRPs) is unique and hence may be used in security applications such as device identification, authentication, and on-demand cryptographic key generation. Strong PUFs promise a huge CRP space exponential in hardware size and hence able to generate, on demand, many and/or very long keys with minimal hardware throughout a device's lifespan. Despite the appeal of strong PUFs, few commercial realizations exist. To enable this, both 1) how to properly manufacture and test strong PUFs, and 2), once fabricated and tested, how to properly integrate such devices into security protocols need to be addressed. The latter is well studied; this award’s research will focus on the relatively unexplored former question. In this project, which brings together two faculty in complementary areas (statistics / information theory and electronic design automation / hardware security), the team will develop a systematic framework for the testing, diagnosing, repairing, and strengthening of strong PUFs. They will train undergraduate and Ph.D. students in testing and verification of hardware security primitives -- engineers with a deep understanding of this new area are indispensable for future trusted IC design and verification teams in the US. This research departs significantly from existing work on PUFs which has largely focused on either proposing new PUFs and evaluating their properties, or on security attacks / defenses of PUF-based protocols. Looking towards a future with ramped up domestic chip fabrication, the investigators focus on what would be needed to bring the promise of PUFs to fruition through: 1) developing new statistical, native fault models for PUF instances, PUF-production lines, and PUF-aging processes; 2) devising testing and diagnosing techniques able to quickly and accurately identify such faults. This could be fed back to electronic design automation tools to iteratively enhance PUF quality control. This differs markedly from existing testing techniques which test chips against a golden behavior. The investigators will also develop techniques to repair faulty, aging, or unreliable PUFs through challenge selection, which may be incorporated into PUF protocols. This line of work represents a careful and statistically motivated exploitation of the largely overlooked huge challenge space of strong PUFs.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

物理上无统治的功能（PUF）是相对较新的设备，通常是电子设备，目前正在设计和调查，以作为各种安全应用程序的硬件安全原始图。电子PUF通过利用芯片制造过程中的一些固有随机性来起作用，该过程产生具有略有随机变化的模拟特征，并结合使用以产生数字功能。这种随机性通常认为在传统的芯片制造过程中是不太细的，这是利用的，当与模数的过程相结合时，就会意识到“挑战到响应”布尔功能。希望是每个设备的挑战 - 响应对列表（CRP）是独一无二的，因此可以在设备识别，身份验证和按需加密密钥生成等安全应用程序中使用。强大的PUF承诺在硬件尺寸上具有巨大的CRP空间指数，因此可以按需生成许多和/或很长的键，并在设备的整个寿命中使用最小的硬件。尽管出现了强大的PUF，但很少有商业实现。为了实现这一点，两者既有1）如何正确制造和测试强PUF，以及2）一旦制造和测试，就需要解决如何将此类设备正确整合到安全协议中。后者是研究良好的；该奖项的研究将重点放在相对出乎意料的以前问题上。在这个项目中，该项目汇集了互补领域的两个教师（统计 /信息理论和电子设计自动化 /硬件安全性），该团队将开发一个系统的框架，用于测试，诊断，修复和增强强PUF。他们将培训本科生和博士学位。对硬件安全基础测试和验证的学生 - 对这一新领域有深刻了解的工程师对于美国的未来值得信赖的IC设计和验证团队是必不可少的。这项研究显着脱离了对PUF的现有工作，该工作主要集中在提案上，并评估其属性，或者是基于PUF的协议的安全攻击 /防御措施。通过增加国内芯片制造的未来，研究人员专注于带来PUF的承诺所需要的东西：1）为PUF实例，PUF生产线和PUF衰老过程开发新的统计，本地故障模型； 2）设计测试和诊断技术可以快速，准确地确定此类故障。这可以馈回电子设计自动化工具，以迭代地增强PUF质量控制。这与现有的测试技术明显不同，后者测试了针对黄金行为的芯片。研究人员还将通过挑战选择来开发技术来修复错误，衰老或不可靠的PUF，这可以纳入PUF方案中。这项工作代表了对强大PUF的巨大挑战空间的谨慎且具有统计学动机的剥削。该奖项反映了NSF的法定任务，并通过使用基金会的知识分子优点和更广泛的影响审查标准来评估，被认为是珍贵的支持。