MRI: Acquisition of an Aberration Corrected Low Energy Electron Microscope (AC-LEEM) for high resolution spectroscopic imaging of surfaces

MRI：获取像差校正低能电子显微镜 (AC-LEEM)，用于表面高分辨率光谱成像

• 批准号: 1828237
• 负责人: David Bell
• 金额: $ 106.75万
• 依托单位: Harvard University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2018
• 资助国家: 美国
• 起止时间: 2018-09-01 至 2021-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1828237&HistoricalAwards=false
• 关键词: MRI; Acquisition; Aberration; Corrected; Low

This award from the Major Research Instrumentation program supports Harvard University with the acquisition of a new type of microscope called a "Low Energy Electron Microscope" which provides revolutionary possibilities for visualization of material surfaces in different environmental conditions. This new microscope will explore the frontiers for surface science research with the ability of visualizing reaction effects in a dynamic mode, surface modifications, surface reconstruction and studies of materials in operating conditions. This microscope is applicable to a wide range of research areas, such as catalysis, energy storage, energy transfer, quantum materials science, nanowires, thin films, photovoltaic and perovskite stability. This cutting-edge instrument will open new avenues for fundamental and applied materials research for next generation of electronics, for energy storage technologies (batteries for example) or for advanced defense applications. This new microscope will be installed at the Center for Nanoscale Systems (CNS), which is a member of the NSF's National Nanotechnology Coordinated Infrastructure Network (NNCI) and a fully open access environment. This instrument will enable the education of students and researchers from multiple institutions across the county in leading-edge science techniques and methodology. With this award from the Major Research Instrumentation program Harvard University will acquire a new type of microscope, an Aberration Corrected Low Energy Electron Microscope (AC-LEEM). LEEM is one of the critical new frontiers techniques for surface analysis with the ability of visualizing reaction effects in a dynamic mode, surface modifications, reconstructions and in-situ research. The AC-LEEM will be installed in an open access environment at the Center for Nanoscale Systems (CNS), which is a member of the NSF's National Nanotechnology Coordinated Infrastructure Network (NNCI). This instrument supports researchers from a broad national base and is applicable to a wide range of materials research areas, such as catalysis, energy storage, energy transfer, quantum materials science, nanowires, thin films, photovoltaic and perovskite stability. This cutting-edge instrument will open new avenues for fundamental and applied research. LEEM enables researchers to explore surface states and surface interfaces, by imaging (LEEM), diffraction (LEED) and spectroscopies, both optical and electron, in extreme detail while dynamically heating/cooling the sample and allowing the addition of a gas (reactive or otherwise) to provide visualization of dynamic surface modifications and reconstructions. This system allows the sample to be heated up to 1500 deg. C. The system allows control of the gas injection for fine-tuning the speed of surface reconstructions and modification. The system incorporates an Ultraviolet light source for Angle-Resolved Photoemission Spectroscopy (ARPES). High resolution Electron Energy Spectroscopy (ES) and mapping can also be performed. The placement in a national user facility allows students and researchers access to this advanced surface analytical instrumentation. This instrument will be integrated into the teaching of materials science, physics, chemistry and catalysis through innovative new educational programs on "nanoscale imaging and analysis" at the graduate, undergraduate and adult education levels. It will enhance Research in Undergraduate Education (REU), Research Experiences for Teachers (RET) and Research Experiences for Veterans (REV) programs and will allow students and teachers to be exposed to cutting edge technology, and the CNS educational outreach models such as workshops, short courses and "open houses" to disseminate new information to a broader audience. This microscope will give the Unites States a competitive edge in materials science research and education.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

主要研究仪器计划的奖项通过获得一种称为“低能电子显微镜”的新型显微镜支持哈佛大学，该显微镜在不同环境条件下可视化材料表面的革命性可能性。 这个新的显微镜将探索表面科学研究的前沿，具有在动态模式，表面修饰，表面重建和操作条件下材料研究中可视化反应效应的能力。该显微镜适用于广泛的研究领域，例如催化，储能，能量转移，量子材料科学，纳米线，薄膜，光伏和钙钛矿稳定性。这种尖端的仪器将为下一代电子产品，储能技术（例如电池）或高级国防应用开放新的途径和应用材料研究。 该新显微镜将安装在NSF国家纳米技术协调基础设施网络（NNCI）和完全开放的访问环境的纳米级系统中心（CNS）中。该工具将使全县多个机构的学生和研究人员接受领先的科学技术和方法论的教育。 通过重大研究仪器计划的奖项，哈佛大学将获得一种新型显微镜，纠正了低能电子显微镜（AC-LEEM）。 LEEM是表面分析的关键新边界技术之一，具有在动态模式，表面修饰，重建和原位研究中可视化反应效应的能力。 Ac-Leem将安装在纳米级系统中心（CNS）的开放访问环境中，该中心是NSF国家纳米技术协调基础设施网络（NNCI）的成员。该仪器支持来自广泛国家基础的研究人员，适用于广泛的材料研究领域，例如催化，能源存储，能量转移，量子材料科学，纳米线，薄膜，光伏和钙钛矿稳定性。这种尖端的工具将为基本和应用研究开辟新的途径。 LEEM使研究人员能够通过成像（LEEM），衍射（LEED）和光学镜头（光学和电子光谱）探索表面状态和表面界面，同时动态加热/冷却样品并添加气体（反应性或其他方式），以提供动态表面修饰和构造的可视化。该系统允许将样品加热至1500度。 C.该系统允许控制气体注入以微调表面重建和修改的速度。该系统结合了一个紫外线光源，用于角度分辨光发射光谱（ARPES）。还可以进行高分辨率电子能谱（ES）和映射。 国家用户设施的安置使学生和研究人员可以访问此高级表面分析仪器。 该乐器将通过有关毕业生，本科和成人教育水平的“纳米级成像和分析”的创新新教育计划来整合到材料科学，物理，化学和催化的教学中。它将增强本科教育（REU）的研究，教师的研究经验（RET）和退伍军人计划的研究经验（REV）计划，并允许学生和教师接触到最先进的技术，以及CNS教育外展模型，例如研讨会，短期课程和“开放式住宅和“开放式房屋”，以将新信息传播给更广阔的受众。 该显微镜将使联合国在材料科学研究和教育方面具有竞争优势。该奖项反映了NSF的法定任务，并使用基金会的知识分子优点和更广泛的影响审查标准，被认为值得通过评估来获得支持。